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Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., p. 1-12.

Pierre Boone (UGent) , Luc Dermaut (UGent) , Philippe Soenen and Joris Degrieck (UGent)
(2000)
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Citation

Please use this url to cite or link to this publication:

MLA
Boone, Pierre, Luc Dermaut, Philippe Soenen, et al. “Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., P. 1-12.” 2000 : n. pag. Print.
APA
Boone, P., Dermaut, L., Soenen, P., & Degrieck, J. (2000). Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., p. 1-12.
Chicago author-date
Boone, Pierre, Luc Dermaut, Philippe Soenen, and Joris Degrieck. 2000. “Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., P. 1-12.”
Chicago author-date (all authors)
Boone, Pierre, Luc Dermaut, Philippe Soenen, and Joris Degrieck. 2000. “Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., P. 1-12.”
Vancouver
1.
Boone P, Dermaut L, Soenen P, Degrieck J. Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., p. 1-12. 2000.
IEEE
[1]
P. Boone, L. Dermaut, P. Soenen, and J. Degrieck, “Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., p. 1-12.” 2000.
@misc{128994,
  author       = {Boone, Pierre and Dermaut, Luc and Soenen, Philippe and Degrieck, Joris},
  language     = {eng},
  title        = {Applications of Laser Metrology to Orthodontic Correction Analysis Sydney 22-24 February 2000. OWLS VI., p. 1-12.},
  year         = {2000},
}