Ghent University Academic Bibliography

Advanced

Fast gate multi-pinhole SPECT simulations

Jan De Beenhouwer UGent and Steven Staelens UGent (2010) IEEE Nuclear Science Symposium Conference Record. p.3634-3637
abstract
Multi-pinhole collimation is increasinly being used in SPECT imaging. A wide variety of geometric designs has recently been introduced, which can easily be modeled with the Monte Carlo simulator GATE. However multi-pinhole simulations are still very inefficient with GATE due to the lack of a dedicated variance reduction technique. In this work, we introduced a pinhole forced detection method which allows for fast 99mTc GATE multi-pinhole simulations. An excellent agreement with analog GATE simulations was found in terms of spatial resolution, energy spectra, sensitivity and collimator penetration. As the collimator-detector response is modeled with full Monte Carlo - without making any assumptions on the detector configuration - our method can be of use in multipinhole collimator design, development of compensation methods and image reconstruction.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
IEEE Nuclear Science Symposium Conference Record
IEEE Nucl. Sci. Symp. Conf. Rec.
issue title
2010 IEEE Nuclear science symposium conference record
article_number
M19-455
pages
3634 - 3637
publisher
IEEE
place of publication
New York, NY, USA
conference name
2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2010)
conference location
Knoxville, TN, USA
conference start
2010-10-30
conference end
2010-11-06
Web of Science type
Proceedings Paper
Web of Science id
000306402903177
ISSN
1082-3654
ISBN
9781424491063
DOI
10.1109/NSSMIC.2010.5874489
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1267622
handle
http://hdl.handle.net/1854/LU-1267622
date created
2011-06-17 15:44:43
date last changed
2013-02-19 15:33:53
@inproceedings{1267622,
  abstract     = {Multi-pinhole collimation is increasinly being used in SPECT imaging. A wide variety of geometric designs has recently been introduced, which can easily be modeled with the Monte Carlo simulator GATE. However multi-pinhole simulations are still very inefficient with GATE due to the lack of a dedicated variance reduction technique. In this work, we introduced a pinhole forced detection method which allows for fast 99mTc GATE multi-pinhole simulations. An excellent agreement with analog GATE simulations was found in terms of spatial resolution, energy spectra, sensitivity and collimator penetration. As the collimator-detector response is modeled with full Monte Carlo - without making any assumptions on the detector configuration - our method can be of use in multipinhole collimator design, development of compensation methods and image reconstruction.},
  articleno    = {M19-455},
  author       = {De Beenhouwer, Jan and Staelens, Steven},
  booktitle    = {IEEE Nuclear Science Symposium Conference Record},
  isbn         = {9781424491063},
  issn         = {1082-3654},
  language     = {eng},
  location     = {Knoxville, TN, USA},
  pages        = {M19-455:3634--M19-455:3637},
  publisher    = {IEEE},
  title        = {Fast gate multi-pinhole SPECT simulations},
  url          = {http://dx.doi.org/10.1109/NSSMIC.2010.5874489},
  year         = {2010},
}

Chicago
De Beenhouwer, Jan, and Steven Staelens. 2010. “Fast Gate Multi-pinhole SPECT Simulations.” In IEEE Nuclear Science Symposium Conference Record, 3634–3637. New York, NY, USA: IEEE.
APA
De Beenhouwer, J., & Staelens, S. (2010). Fast gate multi-pinhole SPECT simulations. IEEE Nuclear Science Symposium Conference Record (pp. 3634–3637). Presented at the 2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2010), New York, NY, USA: IEEE.
Vancouver
1.
De Beenhouwer J, Staelens S. Fast gate multi-pinhole SPECT simulations. IEEE Nuclear Science Symposium Conference Record. New York, NY, USA: IEEE; 2010. p. 3634–7.
MLA
De Beenhouwer, Jan, and Steven Staelens. “Fast Gate Multi-pinhole SPECT Simulations.” IEEE Nuclear Science Symposium Conference Record. New York, NY, USA: IEEE, 2010. 3634–3637. Print.