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Fast gate multi-pinhole SPECT simulations

Jan De Beenhouwer (UGent) and Steven Staelens (UGent)
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Abstract
Multi-pinhole collimation is increasinly being used in SPECT imaging. A wide variety of geometric designs has recently been introduced, which can easily be modeled with the Monte Carlo simulator GATE. However multi-pinhole simulations are still very inefficient with GATE due to the lack of a dedicated variance reduction technique. In this work, we introduced a pinhole forced detection method which allows for fast 99mTc GATE multi-pinhole simulations. An excellent agreement with analog GATE simulations was found in terms of spatial resolution, energy spectra, sensitivity and collimator penetration. As the collimator-detector response is modeled with full Monte Carlo - without making any assumptions on the detector configuration - our method can be of use in multipinhole collimator design, development of compensation methods and image reconstruction.

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Please use this url to cite or link to this publication:

Chicago
De Beenhouwer, Jan, and Steven Staelens. 2010. “Fast Gate Multi-pinhole SPECT Simulations.” In IEEE Nuclear Science Symposium Conference Record, 3634–3637. New York, NY, USA: IEEE.
APA
De Beenhouwer, J., & Staelens, S. (2010). Fast gate multi-pinhole SPECT simulations. IEEE Nuclear Science Symposium Conference Record (pp. 3634–3637). Presented at the 2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2010), New York, NY, USA: IEEE.
Vancouver
1.
De Beenhouwer J, Staelens S. Fast gate multi-pinhole SPECT simulations. IEEE Nuclear Science Symposium Conference Record. New York, NY, USA: IEEE; 2010. p. 3634–7.
MLA
De Beenhouwer, Jan, and Steven Staelens. “Fast Gate Multi-pinhole SPECT Simulations.” IEEE Nuclear Science Symposium Conference Record. New York, NY, USA: IEEE, 2010. 3634–3637. Print.
@inproceedings{1267622,
  abstract     = {Multi-pinhole collimation is increasinly being used in SPECT imaging. A wide variety of geometric designs has recently been introduced, which can easily be modeled with the Monte Carlo simulator GATE. However multi-pinhole simulations are still very inefficient with GATE due to the lack of a dedicated variance reduction technique. In this work, we introduced a pinhole forced detection method which allows for fast 99mTc GATE multi-pinhole simulations. An excellent agreement with analog GATE simulations was found in terms of spatial resolution, energy spectra, sensitivity and collimator penetration. As the collimator-detector response is modeled with full Monte Carlo - without making any assumptions on the detector configuration - our method can be of use in multipinhole collimator design, development of compensation methods and image reconstruction.},
  articleno    = {M19-455},
  author       = {De Beenhouwer, Jan and Staelens, Steven},
  booktitle    = {IEEE Nuclear Science Symposium Conference Record},
  isbn         = {9781424491063},
  issn         = {1082-3654},
  language     = {eng},
  location     = {Knoxville, TN, USA},
  pages        = {M19-455:3634--M19-455:3637},
  publisher    = {IEEE},
  title        = {Fast gate multi-pinhole SPECT simulations},
  url          = {http://dx.doi.org/10.1109/NSSMIC.2010.5874489},
  year         = {2010},
}

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