Ghent University Academic Bibliography

Advanced

In situ x-ray fluorescence measurements during ALD on flat substrates and in nanoporous

Jolien Dendooven UGent, Davy Deduytsche UGent, Sreeprasanth Pulinthanathu Sree, Tamás I Korányi, Gina Vanbutsele, Johan A Martens, Karl F Ludwig and Christophe Detavernier UGent (2010) Atomic Layer Deposition, 10th International conference, Abstracts.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Atomic Layer Deposition, 10th International conference, Abstracts
conference name
10th International conference on Atomic Layer Deposition
conference location
Seoul, South Korea
conference start
2010-06-20
conference end
2010-06-23
language
English
UGent publication?
yes
classification
C3
copyright statement
I have transferred the copyright for this publication to the publisher
id
1245394
handle
http://hdl.handle.net/1854/LU-1245394
date created
2011-05-27 12:20:53
date last changed
2016-12-19 15:36:26
@inproceedings{1245394,
  author       = {Dendooven, Jolien and Deduytsche, Davy and Pulinthanathu Sree, Sreeprasanth and Kor{\'a}nyi, Tam{\'a}s I and Vanbutsele, Gina and Martens, Johan A and Ludwig, Karl F and Detavernier, Christophe},
  booktitle    = {Atomic Layer Deposition, 10th International conference, Abstracts},
  language     = {eng},
  location     = {Seoul, South Korea},
  title        = {In situ x-ray fluorescence measurements during ALD on flat substrates and in nanoporous},
  year         = {2010},
}

Chicago
Dendooven, Jolien, Davy Deduytsche, Sreeprasanth Pulinthanathu Sree, Tamás I Korányi, Gina Vanbutsele, Johan A Martens, Karl F Ludwig, and Christophe Detavernier. 2010. “In Situ X-ray Fluorescence Measurements During ALD on Flat Substrates and in Nanoporous.” In Atomic Layer Deposition, 10th International Conference, Abstracts.
APA
Dendooven, J., Deduytsche, D., Pulinthanathu Sree, S., Korányi, T. I., Vanbutsele, G., Martens, J. A., Ludwig, K. F., et al. (2010). In situ x-ray fluorescence measurements during ALD on flat substrates and in nanoporous. Atomic Layer Deposition, 10th International conference, Abstracts. Presented at the 10th International conference on Atomic Layer Deposition.
Vancouver
1.
Dendooven J, Deduytsche D, Pulinthanathu Sree S, Korányi TI, Vanbutsele G, Martens JA, et al. In situ x-ray fluorescence measurements during ALD on flat substrates and in nanoporous. Atomic Layer Deposition, 10th International conference, Abstracts. 2010.
MLA
Dendooven, Jolien, Davy Deduytsche, Sreeprasanth Pulinthanathu Sree, et al. “In Situ X-ray Fluorescence Measurements During ALD on Flat Substrates and in Nanoporous.” Atomic Layer Deposition, 10th International Conference, Abstracts. 2010. Print.