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Tin-related deep levels in proton-irradiated n-type silicon.

E SIMOEN, C CLAEYS, VB NEIMASH, A KRAITCHINSKII, N KRASKO, O PUZENKO, Anja Blondeel and Paul Clauws (2000) Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys. p.147-156
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author
organization
year
type
conference
publication status
published
subject
in
Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys
pages
147-156 pages
language
English
UGent publication?
yes
classification
C1
id
123799
handle
http://hdl.handle.net/1854/LU-123799
date created
2004-01-14 13:36:00
date last changed
2016-12-19 15:35:50
@inproceedings{123799,
  author       = {SIMOEN, E and CLAEYS, C and NEIMASH, VB and KRAITCHINSKII, A and KRASKO, N and PUZENKO, O and Blondeel, Anja and Clauws, Paul},
  booktitle    = {Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys},
  language     = {eng},
  pages        = {147--156},
  title        = {Tin-related deep levels in proton-irradiated n-type silicon.},
  year         = {2000},
}

Chicago
SIMOEN, E, C CLAEYS, VB NEIMASH, A KRAITCHINSKII, N KRASKO, O PUZENKO, Anja Blondeel, and Paul Clauws. 2000. “Tin-related Deep Levels in Proton-irradiated N-type Silicon.” In Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys, 147–156.
APA
SIMOEN, E., CLAEYS, C., NEIMASH, V., KRAITCHINSKII, A., KRASKO, N., PUZENKO, O., Blondeel, A., et al. (2000). Tin-related deep levels in proton-irradiated n-type silicon. Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys (pp. 147–156).
Vancouver
1.
SIMOEN E, CLAEYS C, NEIMASH V, KRAITCHINSKII A, KRASKO N, PUZENKO O, et al. Tin-related deep levels in proton-irradiated n-type silicon. Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys. 2000. p. 147–56.
MLA
SIMOEN, E, C CLAEYS, VB NEIMASH, et al. “Tin-related Deep Levels in Proton-irradiated N-type Silicon.” Proceedings 2nd ENDEASD Workshop, Kista-Stockholm, Sweden 2000, Editor C.L. Claeys. 2000. 147–156. Print.