Advanced search

Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon.

(2000) JOURNAL OF APPLIED PHYSICS. 87(7). p.3294-3300
Author
Organization

Citation

Please use this url to cite or link to this publication:

Chicago
De Gryse, Olivier, and Paul Clauws. 2000. “Quantification of the Low Temperature Infrared Vibrational Modes from Interstitial Oxygen in Silicon.” Journal of Applied Physics 87 (7): 3294–3300.
APA
De Gryse, Olivier, & Clauws, P. (2000). Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon. JOURNAL OF APPLIED PHYSICS, 87(7), 3294–3300.
Vancouver
1.
De Gryse O, Clauws P. Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon. JOURNAL OF APPLIED PHYSICS. 2000;87(7):3294–300.
MLA
De Gryse, Olivier, and Paul Clauws. “Quantification of the Low Temperature Infrared Vibrational Modes from Interstitial Oxygen in Silicon.” JOURNAL OF APPLIED PHYSICS 87.7 (2000): 3294–3300. Print.
@article{123740,
  author       = {De Gryse, Olivier and Clauws, Paul},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {7},
  pages        = {3294--3300},
  title        = {Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon.},
  volume       = {87},
  year         = {2000},
}

Web of Science
Times cited: