Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon.
- Author
- Olivier De Gryse and Paul Clauws (UGent)
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-123740
- Chicago
- De Gryse, Olivier, and Paul Clauws. 2000. “Quantification of the Low Temperature Infrared Vibrational Modes from Interstitial Oxygen in Silicon.” Journal of Applied Physics 87 (7): 3294–3300.
- APA
- De Gryse, Olivier, & Clauws, P. (2000). Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon. JOURNAL OF APPLIED PHYSICS, 87(7), 3294–3300.
- Vancouver
- 1.De Gryse O, Clauws P. Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon. JOURNAL OF APPLIED PHYSICS. 2000;87(7):3294–300.
- MLA
- De Gryse, Olivier, and Paul Clauws. “Quantification of the Low Temperature Infrared Vibrational Modes from Interstitial Oxygen in Silicon.” JOURNAL OF APPLIED PHYSICS 87.7 (2000): 3294–3300. Print.
@article{123740,
author = {De Gryse, Olivier and Clauws, Paul},
issn = {0021-8979},
journal = {JOURNAL OF APPLIED PHYSICS},
language = {eng},
number = {7},
pages = {3294--3300},
title = {Quantification of the low temperature infrared vibrational modes from interstitial oxygen in silicon.},
volume = {87},
year = {2000},
}