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Trapping, manipulating and measuring single colloidal particles using electric fields

Filip Strubbe (UGent), Masoumeh Karvar (UGent), Bart Verboven (UGent), Filip Beunis (UGent) and Kristiaan Neyts (UGent)
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Chicago
Strubbe, Filip, Masoumeh Karvar, Bart Verboven, Filip Beunis, and Kristiaan Neyts. 2010. “Trapping, Manipulating and Measuring Single Colloidal Particles Using Electric Fields.” In Advanced Light Microscopy Symposium (ALM - 2010), Abstracts, ed. Els Van Damme, Winnok De Vos, and Jeanne Boden, 71–71.
APA
Strubbe, F., Karvar, M., Verboven, B., Beunis, F., & Neyts, K. (2010). Trapping, manipulating and measuring single colloidal particles using electric fields. In Els Van Damme, W. De Vos, & J. Boden (Eds.), Advanced light microscopy symposium (ALM - 2010), Abstracts (pp. 71–71). Presented at the Advanced Light Microscopy Symposium : Imaging strategies for illuminating biological and molecular dynamics (ALM - 2010).
Vancouver
1.
Strubbe F, Karvar M, Verboven B, Beunis F, Neyts K. Trapping, manipulating and measuring single colloidal particles using electric fields. In: Van Damme E, De Vos W, Boden J, editors. Advanced light microscopy symposium (ALM - 2010), Abstracts. 2010. p. 71–71.
MLA
Strubbe, Filip, Masoumeh Karvar, Bart Verboven, et al. “Trapping, Manipulating and Measuring Single Colloidal Particles Using Electric Fields.” Advanced Light Microscopy Symposium (ALM - 2010), Abstracts. Ed. Els Van Damme, Winnok De Vos, & Jeanne Boden. 2010. 71–71. Print.
@inproceedings{1208519,
  author       = {Strubbe, Filip and Karvar, Masoumeh and Verboven, Bart and Beunis, Filip and Neyts, Kristiaan},
  booktitle    = {Advanced light microscopy symposium (ALM - 2010), Abstracts},
  editor       = {Van Damme, Els and De Vos, Winnok and Boden, Jeanne},
  language     = {eng},
  location     = {Ghent, Belgium},
  pages        = {71--71},
  title        = {Trapping, manipulating and measuring single colloidal particles using electric fields},
  year         = {2010},
}