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Characterization of the Biaxiality of the Fuji Wide-View Film.

Koenraad Vermeirsch, Koen D'havé and Bart Verweire (1999) Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999. p.677-681
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999
pages
677-681 pages
language
English
UGent publication?
yes
classification
C1
id
117571
handle
http://hdl.handle.net/1854/LU-117571
date created
2004-01-14 13:35:00
date last changed
2016-12-19 15:35:22
@inproceedings{117571,
  author       = {Vermeirsch, Koenraad and D'hav{\'e}, Koen and Verweire, Bart},
  booktitle    = {Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999},
  language     = {eng},
  pages        = {677--681},
  title        = {Characterization of the Biaxiality of the Fuji Wide-View Film.},
  year         = {1999},
}

Chicago
Vermeirsch, Koenraad, Koen D’havé, and Bart Verweire. 1999. “Characterization of the Biaxiality of the Fuji Wide-View Film.” In Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, Mei 1999, 677–681.
APA
Vermeirsch, Koenraad, D’havé, K., & Verweire, B. (1999). Characterization of the Biaxiality of the Fuji Wide-View Film. Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999 (pp. 677–681).
Vancouver
1.
Vermeirsch K, D’havé K, Verweire B. Characterization of the Biaxiality of the Fuji Wide-View Film. Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999. 1999. p. 677–81.
MLA
Vermeirsch, Koenraad, Koen D’havé, and Bart Verweire. “Characterization of the Biaxiality of the Fuji Wide-View Film.” Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, Mei 1999. 1999. 677–681. Print.