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Chicago
Vermeirsch, Koenraad, Koen D’havé, and Bart Verweire. 1999. “Characterization of the Biaxiality of the Fuji Wide-View Film.” In Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, Mei 1999, 677–681.
APA
Vermeirsch, Koenraad, D’havé, K., & Verweire, B. (1999). Characterization of the Biaxiality of the Fuji Wide-View Film. Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999 (pp. 677–681).
Vancouver
1.
Vermeirsch K, D’havé K, Verweire B. Characterization of the Biaxiality of the Fuji Wide-View Film. Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999. 1999. p. 677–81.
MLA
Vermeirsch, Koenraad, Koen D’havé, and Bart Verweire. “Characterization of the Biaxiality of the Fuji Wide-View Film.” Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, Mei 1999. 1999. 677–681. Print.
@inproceedings{117571,
  author       = {Vermeirsch, Koenraad and D'hav{\'e}, Koen and Verweire, Bart},
  booktitle    = {Digest of SID Symposium, 1999, Vol. XXX, Society of Information Display, Morreale J. (ed.), San Jose, mei 1999},
  language     = {eng},
  pages        = {677--681},
  title        = {Characterization of the Biaxiality of the Fuji Wide-View Film.},
  year         = {1999},
}