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Controlled light exposure microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching

(2008) MICROSCOPY AND MICROANALYSIS. 14(Suppl. S2). p.718-719
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Chicago
Hoebe, Ron, Winnok De Vos, Carel Van Oven, Peter Zoon, Saskia Lambrechts, Patric Van Oostveldt, Dorus Gadella, Ron Van Noorden, and Erik Manders. 2008. “Controlled Light Exposure Microscopy (CLEM) for Prolonged Live-cell Imaging and Strongly Reduced Photobleaching.” Microscopy and Microanalysis 14 (Suppl. S2): 718–719.
APA
Hoebe, Ron, De Vos, W., Van Oven, C., Zoon, P., Lambrechts, S., Van Oostveldt, P., Gadella, D., et al. (2008). Controlled light exposure microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching. MICROSCOPY AND MICROANALYSIS, 14(Suppl. S2), 718–719.
Vancouver
1.
Hoebe R, De Vos W, Van Oven C, Zoon P, Lambrechts S, Van Oostveldt P, et al. Controlled light exposure microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching. MICROSCOPY AND MICROANALYSIS. 2008;14(Suppl. S2):718–9.
MLA
Hoebe, Ron, Winnok De Vos, Carel Van Oven, et al. “Controlled Light Exposure Microscopy (CLEM) for Prolonged Live-cell Imaging and Strongly Reduced Photobleaching.” MICROSCOPY AND MICROANALYSIS 14.Suppl. S2 (2008): 718–719. Print.
@article{1175466,
  author       = {Hoebe, Ron and De Vos, Winnok and Van Oven, Carel and Zoon, Peter and Lambrechts, Saskia and Van Oostveldt, Patric and Gadella, Dorus and Van Noorden, Ron and Manders, Erik},
  issn         = {1431-9276},
  journal      = {MICROSCOPY AND MICROANALYSIS},
  language     = {eng},
  number       = {Suppl. S2},
  pages        = {718--719},
  title        = {Controlled light exposure microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching},
  url          = {http://dx.doi.org/10.1017/S1431927608089010},
  volume       = {14},
  year         = {2008},
}

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