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InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors.

Koen Vanhollebeke, Ingrid Moerman UGent, Peter Van Daele UGent and Piet Demeester UGent (1999) Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA.
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author
organization
year
type
conference
publication status
published
subject
in
Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA
pages
18 pages
language
English
UGent publication?
yes
classification
C1
id
117306
handle
http://hdl.handle.net/1854/LU-117306
date created
2004-01-14 13:35:00
date last changed
2016-12-19 15:35:36
@inproceedings{117306,
  author       = {Vanhollebeke, Koen and Moerman, Ingrid and Van Daele, Peter and Demeester, Piet},
  booktitle    = {Presented at the International Conference on Compliant \& Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA},
  language     = {eng},
  pages        = {18},
  title        = {InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors.},
  year         = {1999},
}

Chicago
Vanhollebeke, Koen, Ingrid Moerman, Peter Van Daele, and Piet Demeester. 1999. “InGaAs Layers Grown by OMVPE on Compliant Substrates for Extended Wavelength Detectors.” In Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA, 18.
APA
Vanhollebeke, K., Moerman, I., Van Daele, P., & Demeester, P. (1999). InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors. Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA (p. 18).
Vancouver
1.
Vanhollebeke K, Moerman I, Van Daele P, Demeester P. InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors. Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA. 1999. p. 18.
MLA
Vanhollebeke, Koen, Ingrid Moerman, Peter Van Daele, et al. “InGaAs Layers Grown by OMVPE on Compliant Substrates for Extended Wavelength Detectors.” Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA. 1999. 18. Print.