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Chicago
Vanhollebeke, Koen, Ingrid Moerman, Peter Van Daele, and Piet Demeester. 1999. “InGaAs Layers Grown by OMVPE on Compliant Substrates for Extended Wavelength Detectors.” In Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA, 18.
APA
Vanhollebeke, K., Moerman, I., Van Daele, P., & Demeester, P. (1999). InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors. Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA (p. 18).
Vancouver
1.
Vanhollebeke K, Moerman I, Van Daele P, Demeester P. InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors. Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA. 1999. p. 18.
MLA
Vanhollebeke, Koen, Ingrid Moerman, Peter Van Daele, et al. “InGaAs Layers Grown by OMVPE on Compliant Substrates for Extended Wavelength Detectors.” Presented at the International Conference on Compliant & Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA. 1999. 18. Print.
@inproceedings{117306,
  author       = {Vanhollebeke, Koen and Moerman, Ingrid and Van Daele, Peter and Demeester, Piet},
  booktitle    = {Presented at the International Conference on Compliant \& Alternative Substrate Technology, 19-23 September 1999, Lake Buena Vista, Florida, USA},
  language     = {eng},
  pages        = {18},
  title        = {InGaAs layers grown by OMVPE on compliant substrates for extended wavelength detectors.},
  year         = {1999},
}