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Comparison of micro-electronic test structures for noise measurement verification.

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Chicago
Van Den Bosch, Sven, Wim De Ketelaere, and Luc Martens. 1999. “Comparison of Micro-electronic Test Structures for Noise Measurement Verification.” In Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, Göteborg, Sweden, 40–44.
APA
Van Den Bosch, S., De Ketelaere, W., & Martens, L. (1999). Comparison of micro-electronic test structures for noise measurement verification. Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, Göteborg, Sweden (pp. 40–44).
Vancouver
1.
Van Den Bosch S, De Ketelaere W, Martens L. Comparison of micro-electronic test structures for noise measurement verification. Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, Göteborg, Sweden. 1999. p. 40–4.
MLA
Van Den Bosch, Sven, Wim De Ketelaere, and Luc Martens. “Comparison of Micro-electronic Test Structures for Noise Measurement Verification.” Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, Göteborg, Sweden. 1999. 40–44. Print.
@inproceedings{117247,
  author       = {Van Den Bosch, Sven and De Ketelaere, Wim and Martens, Luc},
  booktitle    = {Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, G{\"o}teborg, Sweden},
  language     = {eng},
  pages        = {40--44},
  title        = {Comparison of micro-electronic test structures for noise measurement verification.},
  year         = {1999},
}