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Chicago
O’DONNELL, KP, ME WHITE, S PEREIRA, MF WU, A VANTOMME, Wim Van Der Stricht, and Koen Jacobs. 1999. “Photoluminescence Mapping and Rutherford Backscattering of InGaN Epilayers.” In Presented at the 3rd International Conference on Nitride Semiconductors (ICNS3), 4-9 July 1999, Montpellier, France, 87.
APA
O’DONNELL, K., WHITE, M., PEREIRA, S., WU, M., VANTOMME, A., Van Der Stricht, W., & Jacobs, K. (1999). Photoluminescence mapping and Rutherford backscattering of InGaN epilayers. Presented at the 3rd International Conference on Nitride Semiconductors (ICNS3), 4-9 July 1999, Montpellier, France (p. 87).
Vancouver
1.
O’DONNELL K, WHITE M, PEREIRA S, WU M, VANTOMME A, Van Der Stricht W, et al. Photoluminescence mapping and Rutherford backscattering of InGaN epilayers. Presented at the 3rd International Conference on Nitride Semiconductors (ICNS3), 4-9 July 1999, Montpellier, France. 1999. p. 87.
MLA
O’DONNELL, KP, ME WHITE, S PEREIRA, et al. “Photoluminescence Mapping and Rutherford Backscattering of InGaN Epilayers.” Presented at the 3rd International Conference on Nitride Semiconductors (ICNS3), 4-9 July 1999, Montpellier, France. 1999. 87. Print.
@inproceedings{117145,
  author       = {O'DONNELL, KP and WHITE, ME and PEREIRA, S and WU, MF and VANTOMME, A and Van Der Stricht, Wim and Jacobs, Koen},
  booktitle    = {Presented at the 3rd International Conference on Nitride Semiconductors (ICNS3), 4-9 July 1999, Montpellier, France},
  language     = {eng},
  pages        = {87},
  title        = {Photoluminescence mapping and Rutherford backscattering of InGaN epilayers.},
  year         = {1999},
}