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Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers.

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Chicago
O’DONNELL, KP, ME WHITE, S PEREIRA, MF WU, A VANTOMME, Wim Van Der Stricht, and Koen Jacobs. 1999. “Photoluminescence Mapping and Rutherford Backscattering Spectrometry of InGaN Epilayers.” Physica Status Solidi B-basic Research 216 (1): 171–174.
APA
O’DONNELL, K., WHITE, M., PEREIRA, S., WU, M., VANTOMME, A., Van Der Stricht, W., & Jacobs, K. (1999). Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 216(1), 171–174.
Vancouver
1.
O’DONNELL K, WHITE M, PEREIRA S, WU M, VANTOMME A, Van Der Stricht W, et al. Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers. PHYSICA STATUS SOLIDI B-BASIC RESEARCH. 1999;216(1):171–4.
MLA
O’DONNELL, KP, ME WHITE, S PEREIRA, et al. “Photoluminescence Mapping and Rutherford Backscattering Spectrometry of InGaN Epilayers.” PHYSICA STATUS SOLIDI B-BASIC RESEARCH 216.1 (1999): 171–174. Print.
@article{117137,
  author       = {O'DONNELL, KP and WHITE, ME and PEREIRA, S and WU, MF and VANTOMME, A and Van Der Stricht, Wim and Jacobs, Koen},
  issn         = {0370-1972},
  journal      = {PHYSICA STATUS SOLIDI B-BASIC RESEARCH},
  language     = {eng},
  number       = {1},
  pages        = {171--174},
  title        = {Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers.},
  volume       = {216},
  year         = {1999},
}

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