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Confocal microscopy and spectroscopy of InGaN epilayers on sapphire.

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Chicago
O’DONNELL, KP, MJ TOBIN, SC BAYLISS, and Wim Van Der Stricht. 1999. “Confocal Microscopy and Spectroscopy of InGaN Epilayers on Sapphire.” Journal of Microscopy-oxford (105-108 Part 2).
APA
O’DONNELL, K., TOBIN, M., BAYLISS, S., & Van Der Stricht, W. (1999). Confocal microscopy and spectroscopy of InGaN epilayers on sapphire. JOURNAL OF MICROSCOPY-OXFORD, (105-108 Part 2).
Vancouver
1.
O’DONNELL K, TOBIN M, BAYLISS S, Van Der Stricht W. Confocal microscopy and spectroscopy of InGaN epilayers on sapphire. JOURNAL OF MICROSCOPY-OXFORD. 1999;(105-108 Part 2).
MLA
O’DONNELL, KP, MJ TOBIN, SC BAYLISS, et al. “Confocal Microscopy and Spectroscopy of InGaN Epilayers on Sapphire.” JOURNAL OF MICROSCOPY-OXFORD 105-108 Part 2 (1999): n. pag. Print.
@article{117132,
  author       = {O'DONNELL, KP and TOBIN, MJ and BAYLISS, SC and Van Der Stricht, Wim},
  issn         = {0022-2720},
  journal      = {JOURNAL OF MICROSCOPY-OXFORD},
  language     = {eng},
  number       = {105-108 Part 2},
  title        = {Confocal microscopy and spectroscopy of InGaN epilayers on sapphire.},
  year         = {1999},
}

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