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Accurate assessment of WLAN exposure in a wireless sensor testbed

Wout Joseph (UGent) , Leen Verloock (UGent) , Günter Vermeeren (UGent) and Luc Martens (UGent)
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Chicago
Joseph, Wout, Leen Verloock, Günter Vermeeren, and Luc Martens. 2010. “Accurate Assessment of WLAN Exposure in a Wireless Sensor Testbed.” In 32nd Annual Meeting of the Bioelectromagnetics Society (BEMS - 2010), Abstracts.
APA
Joseph, W., Verloock, L., Vermeeren, G., & Martens, L. (2010). Accurate assessment of WLAN exposure in a wireless sensor testbed. 32nd annual meeting of the Bioelectromagnetics Society (BEMS - 2010), Abstracts. Presented at the 32nd Annual Meeting of the Bioelectromagnetics Society (BEMS - 2010).
Vancouver
1.
Joseph W, Verloock L, Vermeeren G, Martens L. Accurate assessment of WLAN exposure in a wireless sensor testbed. 32nd annual meeting of the Bioelectromagnetics Society (BEMS - 2010), Abstracts. 2010.
MLA
Joseph, Wout, Leen Verloock, Günter Vermeeren, et al. “Accurate Assessment of WLAN Exposure in a Wireless Sensor Testbed.” 32nd Annual Meeting of the Bioelectromagnetics Society (BEMS - 2010), Abstracts. 2010. Print.
@inproceedings{1168933,
  author       = {Joseph, Wout and Verloock, Leen and Vermeeren, G{\"u}nter and Martens, Luc},
  booktitle    = {32nd annual meeting of the Bioelectromagnetics Society (BEMS - 2010), Abstracts},
  language     = {eng},
  location     = {Seoul, Korea},
  pages        = {2},
  title        = {Accurate assessment of WLAN exposure in a wireless sensor testbed},
  year         = {2010},
}