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Combining geometric edge detectors for feature detection

Michaël Heyvaert (UGent) , David Van Hamme (UGent) , Jonas Coppens (UGent) and Peter Veelaert (UGent)
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Abstract
We propose a novel framework for the analysis and modeling of discrete edge filters, based on the notion of signed rays. This framework will allow us to easily deduce the geometric and localization properties of a family of first-order filters, and use this information to design custom filter banks for specific applications. As an example, a set of angle-selective corner detectors is constructed for the detection of buildings in video sequences. This clearly illustrates the merit of the theory for solving practical recognition problems.

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MLA
Heyvaert, Michaël, et al. “Combining Geometric Edge Detectors for Feature Detection.” Lecture Notes in Computer Science, edited by Jacques Blanc-Talon et al., vol. 6474, Springer, 2010, pp. 221–32, doi:10.1007/978-3-642-17688-3_22.
APA
Heyvaert, M., Van Hamme, D., Coppens, J., & Veelaert, P. (2010). Combining geometric edge detectors for feature detection. In J. Blanc-Talon, D. Bone, W. Philips, D. Popescu, & P. Scheunders (Eds.), Lecture Notes in Computer Science (Vol. 6474, pp. 221–232). Berlin, Germany: Springer. https://doi.org/10.1007/978-3-642-17688-3_22
Chicago author-date
Heyvaert, Michaël, David Van Hamme, Jonas Coppens, and Peter Veelaert. 2010. “Combining Geometric Edge Detectors for Feature Detection.” In Lecture Notes in Computer Science, edited by Jacques Blanc-Talon, Don Bone, Wilfried Philips, Dan Popescu, and Paul Scheunders, 6474:221–32. Berlin, Germany: Springer. https://doi.org/10.1007/978-3-642-17688-3_22.
Chicago author-date (all authors)
Heyvaert, Michaël, David Van Hamme, Jonas Coppens, and Peter Veelaert. 2010. “Combining Geometric Edge Detectors for Feature Detection.” In Lecture Notes in Computer Science, ed by. Jacques Blanc-Talon, Don Bone, Wilfried Philips, Dan Popescu, and Paul Scheunders, 6474:221–232. Berlin, Germany: Springer. doi:10.1007/978-3-642-17688-3_22.
Vancouver
1.
Heyvaert M, Van Hamme D, Coppens J, Veelaert P. Combining geometric edge detectors for feature detection. In: Blanc-Talon J, Bone D, Philips W, Popescu D, Scheunders P, editors. Lecture Notes in Computer Science. Berlin, Germany: Springer; 2010. p. 221–32.
IEEE
[1]
M. Heyvaert, D. Van Hamme, J. Coppens, and P. Veelaert, “Combining geometric edge detectors for feature detection,” in Lecture Notes in Computer Science, Sydney, Australia, 2010, vol. 6474, pp. 221–232.
@inproceedings{1162857,
  abstract     = {{We propose a novel framework for the analysis and modeling of discrete edge filters, based on the notion of signed rays. This framework will allow us to easily deduce the geometric and localization properties of a family of first-order filters, and use this information to design custom filter banks for specific applications. As an example, a set of angle-selective corner detectors is constructed for the detection of buildings in video sequences. This clearly illustrates the merit of the theory for solving practical recognition problems.}},
  author       = {{Heyvaert, Michaël and Van Hamme, David and Coppens, Jonas and Veelaert, Peter}},
  booktitle    = {{Lecture Notes in Computer Science}},
  editor       = {{Blanc-Talon, Jacques and Bone, Don and Philips, Wilfried and Popescu, Dan and Scheunders, Paul}},
  isbn         = {{9783642176906}},
  issn         = {{0302-9743}},
  language     = {{eng}},
  location     = {{Sydney, Australia}},
  pages        = {{221--232}},
  publisher    = {{Springer}},
  title        = {{Combining geometric edge detectors for feature detection}},
  url          = {{http://dx.doi.org/10.1007/978-3-642-17688-3_22}},
  volume       = {{6474}},
  year         = {{2010}},
}

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