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Fields at a finite conducting wedge and applications in interconnect modeling

Thomas Demeester UGent and Daniël De Zutter UGent (2010) IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 58(8). p.2158-2165
abstract
The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
finite conductivity, inductance, edge effect, Conductor, resistance, skin effect, surface impedance, transmission line parameters, wedge, TRANSMISSION-LINE PARAMETERS, RECTANGULAR CROSS-SECTION, INTERNAL IMPEDANCE, ELECTROMAGNETIC-FIELD, EDDY CURRENTS, AC RESISTANCE, LOSSY LINES, SKIN, INDUCTANCE, BEHAVIOR
journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
IEEE Trans. Microw. Theory Tech.
volume
58
issue
8
pages
2158 - 2165
Web of Science type
Article
Web of Science id
000283057400011
JCR category
ENGINEERING, ELECTRICAL & ELECTRONIC
JCR impact factor
2.015 (2010)
JCR rank
42/247 (2010)
JCR quartile
1 (2010)
ISSN
0018-9480
DOI
10.1109/TMTT.2010.2053061
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1162131
handle
http://hdl.handle.net/1854/LU-1162131
date created
2011-02-21 12:54:05
date last changed
2016-12-19 15:38:08
@article{1162131,
  abstract     = {The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.},
  author       = {Demeester, Thomas and De Zutter, Dani{\"e}l},
  issn         = {0018-9480},
  journal      = {IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES},
  keyword      = {finite conductivity,inductance,edge effect,Conductor,resistance,skin effect,surface impedance,transmission line parameters,wedge,TRANSMISSION-LINE PARAMETERS,RECTANGULAR CROSS-SECTION,INTERNAL IMPEDANCE,ELECTROMAGNETIC-FIELD,EDDY CURRENTS,AC RESISTANCE,LOSSY LINES,SKIN,INDUCTANCE,BEHAVIOR},
  language     = {eng},
  number       = {8},
  pages        = {2158--2165},
  title        = {Fields at a finite conducting wedge and applications in interconnect modeling},
  url          = {http://dx.doi.org/10.1109/TMTT.2010.2053061},
  volume       = {58},
  year         = {2010},
}

Chicago
Demeester, Thomas, and Daniël De Zutter. 2010. “Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling.” Ieee Transactions on Microwave Theory and Techniques 58 (8): 2158–2165.
APA
Demeester, T., & De Zutter, D. (2010). Fields at a finite conducting wedge and applications in interconnect modeling. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 58(8), 2158–2165.
Vancouver
1.
Demeester T, De Zutter D. Fields at a finite conducting wedge and applications in interconnect modeling. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2010;58(8):2158–65.
MLA
Demeester, Thomas, and Daniël De Zutter. “Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling.” IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 58.8 (2010): 2158–2165. Print.