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Fields at a finite conducting wedge and applications in interconnect modeling

Thomas Demeester (UGent) and Daniël De Zutter (UGent)
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Abstract
The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.
Keywords
finite conductivity, inductance, edge effect, Conductor, resistance, skin effect, surface impedance, transmission line parameters, wedge, TRANSMISSION-LINE PARAMETERS, RECTANGULAR CROSS-SECTION, INTERNAL IMPEDANCE, ELECTROMAGNETIC-FIELD, EDDY CURRENTS, AC RESISTANCE, LOSSY LINES, SKIN, INDUCTANCE, BEHAVIOR

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Citation

Please use this url to cite or link to this publication:

Chicago
Demeester, Thomas, and Daniël De Zutter. 2010. “Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling.” Ieee Transactions on Microwave Theory and Techniques 58 (8): 2158–2165.
APA
Demeester, Thomas, & De Zutter, D. (2010). Fields at a finite conducting wedge and applications in interconnect modeling. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 58(8), 2158–2165.
Vancouver
1.
Demeester T, De Zutter D. Fields at a finite conducting wedge and applications in interconnect modeling. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2010;58(8):2158–65.
MLA
Demeester, Thomas, and Daniël De Zutter. “Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling.” IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 58.8 (2010): 2158–2165. Print.
@article{1162131,
  abstract     = {The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.},
  author       = {Demeester, Thomas and De Zutter, Dani{\"e}l},
  issn         = {0018-9480},
  journal      = {IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES},
  keyword      = {finite conductivity,inductance,edge effect,Conductor,resistance,skin effect,surface impedance,transmission line parameters,wedge,TRANSMISSION-LINE PARAMETERS,RECTANGULAR CROSS-SECTION,INTERNAL IMPEDANCE,ELECTROMAGNETIC-FIELD,EDDY CURRENTS,AC RESISTANCE,LOSSY LINES,SKIN,INDUCTANCE,BEHAVIOR},
  language     = {eng},
  number       = {8},
  pages        = {2158--2165},
  title        = {Fields at a finite conducting wedge and applications in interconnect modeling},
  url          = {http://dx.doi.org/10.1109/TMTT.2010.2053061},
  volume       = {58},
  year         = {2010},
}

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