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Chicago
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, and Eyke Hüllermeier. 2010. “On Label Dependence in Multilabel Classification.” In LastCFP : ICML Workshop on Learning from Multi-label Data, Proceedings, ed. Gregorios Tsoumakas. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control.
APA
Dembszynski, K., Waegeman, W., Cheng, W., & Hüllermeier, E. (2010). On label dependence in multilabel classification. In G. Tsoumakas (Ed.), LastCFP : ICML workshop on learning from multi-label data, Proceedings. Presented at the LastCFP : ICML Workshop on Learning from Multi-label data, Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control.
Vancouver
1.
Dembszynski K, Waegeman W, Cheng W, Hüllermeier E. On label dependence in multilabel classification. In: Tsoumakas G, editor. LastCFP : ICML workshop on learning from multi-label data, Proceedings. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control; 2010.
MLA
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, et al. “On Label Dependence in Multilabel Classification.” LastCFP : ICML Workshop on Learning from Multi-label Data, Proceedings. Ed. Gregorios Tsoumakas. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control, 2010. Print.
@inproceedings{1155414,
  author       = {Dembszynski, Krzysztof and Waegeman, Willem and Cheng, Weiwei and H{\"u}llermeier, Eyke},
  booktitle    = {LastCFP : ICML workshop on learning from multi-label data, Proceedings},
  editor       = {Tsoumakas, Gregorios},
  language     = {eng},
  location     = {Haifa, Israel},
  pages        = {8},
  publisher    = {Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control},
  title        = {On label dependence in multilabel classification},
  year         = {2010},
}