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On label dependence in multilabel classification

Krzysztof Dembszynski, Willem Waegeman UGent, Weiwei Cheng and Eyke Hüllermeier (2010) LastCFP : ICML workshop on learning from multi-label data, Proceedings.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
LastCFP : ICML workshop on learning from multi-label data, Proceedings
editor
Gregorios Tsoumakas
pages
8 pages
publisher
Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control
place of publication
Ghent, Belgium
conference name
LastCFP : ICML Workshop on Learning from Multi-label data
conference location
Haifa, Israel
conference start
2010-06-25
conference end
2010-06-25
language
English
UGent publication?
yes
classification
C1
copyright statement
I have retained and own the full copyright for this publication
id
1155414
handle
http://hdl.handle.net/1854/LU-1155414
date created
2011-02-18 11:27:09
date last changed
2011-05-05 13:45:52
@inproceedings{1155414,
  author       = {Dembszynski, Krzysztof and Waegeman, Willem and Cheng, Weiwei and H{\"u}llermeier, Eyke},
  booktitle    = {LastCFP : ICML workshop on learning from multi-label data, Proceedings},
  editor       = {Tsoumakas, Gregorios},
  language     = {eng},
  location     = {Haifa, Israel},
  pages        = {8},
  publisher    = {Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control},
  title        = {On label dependence in multilabel classification},
  year         = {2010},
}

Chicago
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, and Eyke Hüllermeier. 2010. “On Label Dependence in Multilabel Classification.” In LastCFP : ICML Workshop on Learning from Multi-label Data, Proceedings, ed. Gregorios Tsoumakas. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control.
APA
Dembszynski, K., Waegeman, W., Cheng, W., & Hüllermeier, E. (2010). On label dependence in multilabel classification. In G. Tsoumakas (Ed.), LastCFP : ICML workshop on learning from multi-label data, Proceedings. Presented at the LastCFP : ICML Workshop on Learning from Multi-label data, Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control.
Vancouver
1.
Dembszynski K, Waegeman W, Cheng W, Hüllermeier E. On label dependence in multilabel classification. In: Tsoumakas G, editor. LastCFP : ICML workshop on learning from multi-label data, Proceedings. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control; 2010.
MLA
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, et al. “On Label Dependence in Multilabel Classification.” LastCFP : ICML Workshop on Learning from Multi-label Data, Proceedings. Ed. Gregorios Tsoumakas. Ghent, Belgium: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control, 2010. Print.