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Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss

Krzysztof Dembszynski, Willem Waegeman UGent, Weiwei Cheng and Eyke Hüllermeier (2010) LECTURE NOTES IN ARTIFICIAL INTELLIGENCE. 6321. p.280-295
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
Lect. Notes Comput. Sci.
editor
José Luis Balcázar, Francesco Bonchi, Aristides Gionis and Michèle Sebag
volume
6321
issue title
Machine learning and knowledge discovery in databases
pages
280 - 295
publisher
Springer Verlag Berlin
place of publication
Berlin, Germany
conference name
European conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases (ECML PKDD 2010)
conference location
Barcelona, Spain
conference start
2010-09-20
conference end
2010-09-24
ISSN
0302-9743
ISBN
9783642158797
DOI
10.1007/978-3-642-15880-3_24
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1155381
handle
http://hdl.handle.net/1854/LU-1155381
date created
2011-02-18 11:06:49
date last changed
2011-05-10 09:41:38
@inproceedings{1155381,
  author       = {Dembszynski, Krzysztof and Waegeman, Willem and Cheng, Weiwei and H{\"u}llermeier, Eyke},
  booktitle    = {LECTURE NOTES IN ARTIFICIAL INTELLIGENCE},
  editor       = {Balc{\'a}zar, Jos{\'e} Luis and Bonchi, Francesco and Gionis, Aristides and Sebag, Mich{\`e}le},
  isbn         = {9783642158797},
  issn         = {0302-9743},
  language     = {eng},
  location     = {Barcelona, Spain},
  pages        = {280--295},
  publisher    = {Springer Verlag Berlin},
  title        = {Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss},
  url          = {http://dx.doi.org/10.1007/978-3-642-15880-3\_24},
  volume       = {6321},
  year         = {2010},
}

Chicago
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, and Eyke Hüllermeier. 2010. “Regret Analysis for Performance Metrics in Multi-label Classification: The Case of Hamming and Subset Zero-one Loss.” In Lecture Notes in Artificial Intelligence, ed. José Luis Balcázar, Francesco Bonchi, Aristides Gionis, and Michèle Sebag, 6321:280–295. Berlin, Germany: Springer Verlag Berlin.
APA
Dembszynski, K., Waegeman, W., Cheng, W., & Hüllermeier, E. (2010). Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss. In J. L. Balcázar, F. Bonchi, A. Gionis, & M. Sebag (Eds.), LECTURE NOTES IN ARTIFICIAL INTELLIGENCE (Vol. 6321, pp. 280–295). Presented at the European conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases (ECML PKDD 2010), Berlin, Germany: Springer Verlag Berlin.
Vancouver
1.
Dembszynski K, Waegeman W, Cheng W, Hüllermeier E. Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss. In: Balcázar JL, Bonchi F, Gionis A, Sebag M, editors. LECTURE NOTES IN ARTIFICIAL INTELLIGENCE. Berlin, Germany: Springer Verlag Berlin; 2010. p. 280–95.
MLA
Dembszynski, Krzysztof, Willem Waegeman, Weiwei Cheng, et al. “Regret Analysis for Performance Metrics in Multi-label Classification: The Case of Hamming and Subset Zero-one Loss.” Lecture Notes in Artificial Intelligence. Ed. José Luis Balcázar et al. Vol. 6321. Berlin, Germany: Springer Verlag Berlin, 2010. 280–295. Print.