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Enhanced sensitivity of absorption-based surface plasmon interference sensors in silicon-on-insulator by adsorbed layer

Khai Le Quang (UGent) and Peter Bienstman (UGent)
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Chicago
Le Quang, Khai, and Peter Bienstman. 2010. “Enhanced Sensitivity of Absorption-based Surface Plasmon Interference Sensors in Silicon-on-insulator by Adsorbed Layer.” In ECIO 2010 Cambridge : 15th European Conference on Integrated Optics.
APA
Le Quang, K., & Bienstman, P. (2010). Enhanced sensitivity of absorption-based surface plasmon interference sensors in silicon-on-insulator by adsorbed layer. ECIO 2010 Cambridge : 15th European conference on integrated optics. Presented at the 15th European conference on Integrated Optics (ECIO 2010).
Vancouver
1.
Le Quang K, Bienstman P. Enhanced sensitivity of absorption-based surface plasmon interference sensors in silicon-on-insulator by adsorbed layer. ECIO 2010 Cambridge : 15th European conference on integrated optics. 2010.
MLA
Le Quang, Khai, and Peter Bienstman. “Enhanced Sensitivity of Absorption-based Surface Plasmon Interference Sensors in Silicon-on-insulator by Adsorbed Layer.” ECIO 2010 Cambridge : 15th European Conference on Integrated Optics. 2010. Print.
@inproceedings{1146561,
  articleno    = {WeP28},
  author       = {Le Quang, Khai and Bienstman, Peter},
  booktitle    = {ECIO 2010 Cambridge : 15th European conference on integrated optics},
  language     = {eng},
  location     = {Cambridge, UK},
  pages        = {3},
  title        = {Enhanced sensitivity of absorption-based surface plasmon interference sensors in silicon-on-insulator by adsorbed layer},
  year         = {2010},
}