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Transient photoconductivity study of shallow electron traps in [Ru(CN)(6)](4-) doped AgCl microcrystals: effects of doping concentration and position.

(1999) IMAGING SCIENCE JOURNAL. 47(2). p.71-79
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Chicago
Hua, Jian, Freddy Callens, Felix Cardon, and D VANDENBROUCKE. 1999. “Transient Photoconductivity Study of Shallow Electron Traps in [Ru(CN)(6)](4-) Doped AgCl Microcrystals: Effects of Doping Concentration and Position.” Imaging Science Journal 47 (2): 71–79.
APA
Hua, J., Callens, F., Cardon, F., & VANDENBROUCKE, D. (1999). Transient photoconductivity study of shallow electron traps in [Ru(CN)(6)](4-) doped AgCl microcrystals: effects of doping concentration and position. IMAGING SCIENCE JOURNAL, 47(2), 71–79.
Vancouver
1.
Hua J, Callens F, Cardon F, VANDENBROUCKE D. Transient photoconductivity study of shallow electron traps in [Ru(CN)(6)](4-) doped AgCl microcrystals: effects of doping concentration and position. IMAGING SCIENCE JOURNAL. 1999;47(2):71–9.
MLA
Hua, Jian, Freddy Callens, Felix Cardon, et al. “Transient Photoconductivity Study of Shallow Electron Traps in [Ru(CN)(6)](4-) Doped AgCl Microcrystals: Effects of Doping Concentration and Position.” IMAGING SCIENCE JOURNAL 47.2 (1999): 71–79. Print.
@article{111590,
  author       = {Hua, Jian and Callens, Freddy and Cardon, Felix and VANDENBROUCKE, D},
  issn         = {1368-2199},
  journal      = {IMAGING SCIENCE JOURNAL},
  language     = {eng},
  number       = {2},
  pages        = {71--79},
  title        = {Transient photoconductivity study of shallow electron traps in [Ru(CN)(6)](4-) doped AgCl microcrystals: effects of doping concentration and position.},
  volume       = {47},
  year         = {1999},
}

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