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Phase contrast in laboratory‐based X‐ray micro/nano‐CT

Yoni De Witte UGent, Matthieu Boone UGent, Manuel Dierick UGent and Luc Van Hoorebeke UGent (2010) XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. p.225-225
abstract
X‐ray micro/nano‐CT has evolved into an extremely valuable tool for various research fields. The current state‐of‐the‐art laboratory‐based systems can scan samples with a resolution below 1 micrometer. Achieving such high resolution usually means scanning very small and thus low absorbing samples, which is done using an X‐ray tube with a very small focal spot size. Under these conditions, the acquired projections not only contain absorption contrast, but also phase contrast due to refraction of the X‐rays. This phase contrast results in edge enhancement, which can be beneficial to detect very small features in radiography. In tomography however, the reconstruction of such mixed projections using a conventional algorithm yields cross‐sections that are severely distorted by so‐called phase contrast artifacts. These artifacts can be prevented by applying a phase retrieval method like the Modified Bronnikov Algorithm (MBA) [1], or the similar simultaneous phase and amplitude extraction [2], which allows reconstructing the object’s refraction function instead of its attenuation function. Alternatively, one can use the Bronnikov‐Aided Correction (BAC) [3] to reduce the phase contrast signal in the projections, which can then be reconstructed without introducing phase artifacts in the reconstructed attenuation function. At the Centre for X‐ray Tomography of the Ghent University (UGCT), these two complementary methods MBA and BAC are commonly applied in every‐day practice, thereby improving the reconstruction quality of high‐resolution CT scans significantly [3,4] (illustrated in figures 1 and 2). Since neither method requires changes in the scanner hardware or the acquisition, they can be readily applied to projection data from any high‐resolution scanner. In addition to results from the scanners of UGCT, results will also be presented for the successful application of both methods on data acquired using other high‐end Xray micro/nano CT systems.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
micro-CT, phase contrast, X-ray microscopy
in
XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts
pages
225 - 225
publisher
Argonne National Laboratory
place of publication
Chicago, IL, USA
conference name
10th International conference on X‐Ray Microscopy (XRM 2010)
conference location
Chicago, IL, USA
conference start
2010-08-15
conference end
2010-08-20
language
English
UGent publication?
yes
classification
C3
copyright statement
I have transferred the copyright for this publication to the publisher
id
1105889
handle
http://hdl.handle.net/1854/LU-1105889
date created
2011-01-20 13:56:59
date last changed
2017-01-02 09:52:32
@inproceedings{1105889,
  abstract     = {X\unmatched{2010}ray micro/nano\unmatched{2010}CT has evolved into an extremely valuable tool for various research fields. The current state\unmatched{2010}of\unmatched{2010}the\unmatched{2010}art laboratory\unmatched{2010}based systems can scan samples with a resolution below 1 micrometer. Achieving such high resolution usually means scanning very small and thus low absorbing samples, which is done using an X\unmatched{2010}ray tube with a very small focal spot size. Under these conditions, the acquired projections not only contain absorption contrast, but also phase contrast due to refraction of the X\unmatched{2010}rays. This phase contrast results in edge enhancement, which can be beneficial to detect very small features in radiography. In tomography however, the reconstruction of such mixed projections using a conventional algorithm yields cross\unmatched{2010}sections that are severely distorted by so\unmatched{2010}called phase contrast artifacts. These artifacts can be prevented by applying a phase retrieval method like the Modified Bronnikov Algorithm (MBA) [1], or the similar simultaneous phase and amplitude extraction [2], which allows reconstructing the object{\textquoteright}s refraction function instead of its attenuation function. Alternatively, one can use the Bronnikov\unmatched{2010}Aided Correction (BAC) [3] to reduce the phase contrast signal in the projections, which can then be reconstructed without introducing phase artifacts in the reconstructed attenuation function. At the Centre for X\unmatched{2010}ray Tomography of the Ghent University (UGCT), these two complementary methods MBA and BAC are commonly applied in every\unmatched{2010}day practice, thereby improving the reconstruction quality of high\unmatched{2010}resolution CT scans significantly [3,4] (illustrated in figures 1 and 2). Since neither method requires changes in the scanner hardware or the acquisition, they can be readily applied to projection data from any high\unmatched{2010}resolution scanner. In addition to results from the scanners of UGCT, results will also be presented for the successful application of both methods on data acquired using other high\unmatched{2010}end Xray micro/nano CT systems.},
  author       = {De Witte, Yoni and Boone, Matthieu and Dierick, Manuel and Van Hoorebeke, Luc},
  booktitle    = {XRM2010 : 10th International conference on X\unmatched{2010}Ray Microscopy, Book of abstracts},
  keyword      = {micro-CT,phase contrast,X-ray microscopy},
  language     = {eng},
  location     = {Chicago, IL, USA},
  pages        = {225--225},
  publisher    = {Argonne National Laboratory},
  title        = {Phase contrast in laboratory\unmatched{2010}based X\unmatched{2010}ray micro/nano\unmatched{2010}CT},
  year         = {2010},
}

Chicago
De Witte, Yoni, Matthieu Boone, Manuel Dierick, and Luc Van Hoorebeke. 2010. “Phase Contrast in Laboratory‐based X‐ray micro/nano‐CT.” In XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts, 225–225. Chicago, IL, USA: Argonne National Laboratory.
APA
De Witte, Y., Boone, M., Dierick, M., & Van Hoorebeke, L. (2010). Phase contrast in laboratory‐based X‐ray micro/nano‐CT. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts (pp. 225–225). Presented at the 10th International conference on X‐Ray Microscopy (XRM 2010), Chicago, IL, USA: Argonne National Laboratory.
Vancouver
1.
De Witte Y, Boone M, Dierick M, Van Hoorebeke L. Phase contrast in laboratory‐based X‐ray micro/nano‐CT. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. Chicago, IL, USA: Argonne National Laboratory; 2010. p. 225–225.
MLA
De Witte, Yoni, Matthieu Boone, Manuel Dierick, et al. “Phase Contrast in Laboratory‐based X‐ray micro/nano‐CT.” XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts. Chicago, IL, USA: Argonne National Laboratory, 2010. 225–225. Print.