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Latest developments in 3D analysis of CT data by Morpho+

Loes Brabant UGent, Jelle Vlassenbroeck UGent, Veerle Cnudde UGent, Yoni De Witte UGent, Luc Van Hoorebeke UGent and Patric Jacobs UGent (2010) XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. p.220-220
abstract
At the Centre for X‐ray Tomography of the Ghent University (Belgium) (www.ugct.ugent.be), a lot of progress is being made in hardware development for high‐resolution X‐ray CT scanners as well as in the field of software for data reconstruction and 3D analysis. We present the latest developments in the inhouse developed package Morpho+ [1], a flexible 3D analysis software program which provides several structural 3D parameters of a scanned sample. Morpho+ is able to calculate several geometrical parameters for both the complete sample as for specific components of the sample, such as grains or pores. These parameters include the surface, diameter of the maximum inscribed sphere, diameter of the minimum circumscribed sphere, equivalent diameter, orientation and a measure for the sphericity (shape parameter). In addition, total sample porosity (or volume fraction) and partial porosity (radial and longitudinal) can be determined. To measure the connectivity of the sample, a skeletonization algorithm and calculation of parameters such as the Euler Number and the size of bottlenecks of a network are included in the program. Morpho+ produces a quantitative output, but it is also possible to visualize the different steps of the analysis, enabling easy interpretation of the results. For example different elements in a 3D volume can be colour‐labelled based on their size. Additionally, the surfaces of the analysed components can be saved an STL‐file for easy visualisation or further analysis.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
micro-CT, X-ray microscopy, 3D analysis
in
XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts
pages
220 - 220
publisher
Argonne National Laboratory
place of publication
Chicago, IL, USA
conference name
10th International conference on X‐Ray Microscopy (XRM 2010)
conference location
Chicago, IL, USA
conference start
2010-08-15
conference end
2010-08-20
language
English
UGent publication?
yes
classification
C3
copyright statement
I have transferred the copyright for this publication to the publisher
id
1105876
handle
http://hdl.handle.net/1854/LU-1105876
date created
2011-01-20 13:53:14
date last changed
2017-01-02 09:52:45
@inproceedings{1105876,
  abstract     = {At the Centre for X\unmatched{2010}ray Tomography of the Ghent University (Belgium) (www.ugct.ugent.be), a lot of progress is being made in hardware development for high\unmatched{2010}resolution X\unmatched{2010}ray CT scanners as well as in the field of software for data reconstruction and 3D analysis. We present the latest developments in the inhouse developed package Morpho+ [1], a flexible 3D analysis software program which provides several structural 3D parameters of a scanned sample.
Morpho+ is able to calculate several geometrical parameters for both the complete sample as for specific components of the sample, such as grains or pores. These parameters include the surface, diameter of the maximum inscribed sphere, diameter of the minimum circumscribed sphere, equivalent diameter, orientation and a measure for the sphericity (shape parameter). In addition, total sample porosity (or volume fraction) and partial porosity (radial and longitudinal) can be determined. To measure the connectivity of the sample, a skeletonization algorithm and calculation of parameters such as the Euler Number and the size of bottlenecks of a network are included in the program. Morpho+ produces a quantitative output, but it is also possible to visualize the different steps of the analysis, enabling easy interpretation of the results. For example different elements in a 3D volume can be colour\unmatched{2010}labelled based on their size. Additionally, the surfaces of the analysed components can be saved an STL\unmatched{2010}file for easy visualisation or further analysis.},
  author       = {Brabant, Loes and Vlassenbroeck, Jelle and Cnudde, Veerle and De Witte, Yoni and Van Hoorebeke, Luc and Jacobs, Patric},
  booktitle    = {XRM2010 : 10th International conference on X\unmatched{2010}Ray Microscopy, Book of abstracts},
  keyword      = {micro-CT,X-ray microscopy,3D analysis},
  language     = {eng},
  location     = {Chicago, IL, USA},
  pages        = {220--220},
  publisher    = {Argonne National Laboratory},
  title        = {Latest developments in 3D analysis of CT data by Morpho+},
  year         = {2010},
}

Chicago
Brabant, Loes, Jelle Vlassenbroeck, Veerle Cnudde, Yoni De Witte, Luc Van Hoorebeke, and Patric Jacobs. 2010. “Latest Developments in 3D Analysis of CT Data by Morpho+.” In XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts, 220–220. Chicago, IL, USA: Argonne National Laboratory.
APA
Brabant, L., Vlassenbroeck, J., Cnudde, V., De Witte, Y., Van Hoorebeke, L., & Jacobs, P. (2010). Latest developments in 3D analysis of CT data by Morpho+. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts (pp. 220–220). Presented at the 10th International conference on X‐Ray Microscopy (XRM 2010), Chicago, IL, USA: Argonne National Laboratory.
Vancouver
1.
Brabant L, Vlassenbroeck J, Cnudde V, De Witte Y, Van Hoorebeke L, Jacobs P. Latest developments in 3D analysis of CT data by Morpho+. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. Chicago, IL, USA: Argonne National Laboratory; 2010. p. 220–220.
MLA
Brabant, Loes, Jelle Vlassenbroeck, Veerle Cnudde, et al. “Latest Developments in 3D Analysis of CT Data by Morpho+.” XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts. Chicago, IL, USA: Argonne National Laboratory, 2010. 220–220. Print.