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Improved visualization using phase retrieval algorithms in laboratory X‐ray μCT

Matthieu Boone UGent, Yoni De Witte UGent, Manuel Dierick UGent, Ana Almeida, Jan Van den Bulcke UGent and Luc Van Hoorebeke UGent (2010) XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. p.219-219
abstract
In recent years, X‐ray microtomography (μCT) has become a very powerful tool for non destructive visualization and analysis in many fields. Due to the quickly increasing achievable resolution, it has become possible to scan very small samples with high accuracy. However, X‐ray attenuation can become very small in these samples, especially in organic material. Besides X‐ray attenuation, X‐ray refraction becomes visible at the edges of the samples. This effect, called phase contrast, results in a typical edge‐enhancement profile on the projection data. This gives rise to artifacts in the reconstructed data if “uncorrected” projection data are being used. Several methods exist to exploit this phase contrast effect. For laboratory setups with X‐ray tubes, the most important are the use of phase gratings [1] and phase retrieval [2,3] or removal [4] based on image processing. A particular effect of the phase retrieval algorithm is an improvement of the visibility of very small density fluctuations in a matrix. This effect will be demonstrated in this work based on two different samples. A fungus inside a wood sample (Figure 1) is hardly visible in the normal reconstruction, but phase retrieval reveals the fungus filling up some cells. Figure 2 shows a pharmaceutical sample where regions with fewer micropores become visible in phase retrieval reconstruction.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
phase contrast, X-ray microscopy, micro-CT
in
XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts
pages
219 - 219
publisher
Argonne National Laboratory
place of publication
Chicago, IL, USA
conference name
10th International conference on X‐Ray Microscopy (XRM 2010)
conference location
Chicago, IL, USA
conference start
2010-08-15
conference end
2010-08-20
language
English
UGent publication?
yes
classification
C3
copyright statement
I have transferred the copyright for this publication to the publisher
id
1105717
handle
http://hdl.handle.net/1854/LU-1105717
date created
2011-01-20 13:48:49
date last changed
2017-01-02 09:52:27
@inproceedings{1105717,
  abstract     = {In recent years, X\unmatched{2010}ray microtomography (\ensuremath{\mu}CT) has become a very powerful tool for non destructive visualization and analysis in many fields. Due to the quickly increasing achievable resolution, it has become possible to scan very small samples with high accuracy. However, X\unmatched{2010}ray attenuation can become very small in these samples, especially in organic material.
Besides X\unmatched{2010}ray attenuation, X\unmatched{2010}ray refraction becomes visible at the edges of the samples. This effect, called phase contrast, results in a typical edge\unmatched{2010}enhancement profile on the projection data. This gives rise to artifacts in the reconstructed data if {\textquotedblleft}uncorrected{\textquotedblright} projection data are being used.
Several methods exist to exploit this phase contrast effect. For laboratory setups with X\unmatched{2010}ray tubes, the most important are the use of phase gratings [1] and phase retrieval [2,3] or removal [4] based on image processing.
A particular effect of the phase retrieval algorithm is an improvement of the visibility of very small density fluctuations in a matrix. This effect will be demonstrated in this work based on two different samples. A fungus inside a wood sample (Figure 1) is hardly visible in the normal reconstruction, but phase retrieval reveals the fungus filling up some cells. Figure 2 shows a pharmaceutical sample where regions with fewer micropores become visible in phase retrieval reconstruction.},
  author       = {Boone, Matthieu and De Witte, Yoni and Dierick, Manuel and Almeida, Ana and Van den Bulcke, Jan and Van Hoorebeke, Luc},
  booktitle    = {XRM2010 : 10th International conference on X\unmatched{2010}Ray Microscopy, Book of abstracts},
  keyword      = {phase contrast,X-ray microscopy,micro-CT},
  language     = {eng},
  location     = {Chicago, IL, USA},
  pages        = {219--219},
  publisher    = {Argonne National Laboratory},
  title        = {Improved visualization using phase retrieval algorithms in laboratory X\unmatched{2010}ray \ensuremath{\mu}CT},
  year         = {2010},
}

Chicago
Boone, Matthieu, Yoni De Witte, Manuel Dierick, Ana Almeida, Jan Van den Bulcke, and Luc Van Hoorebeke. 2010. “Improved Visualization Using Phase Retrieval Algorithms in Laboratory X‐ray μCT.” In XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts, 219–219. Chicago, IL, USA: Argonne National Laboratory.
APA
Boone, Matthieu, De Witte, Y., Dierick, M., Almeida, A., Van den Bulcke, J., & Van Hoorebeke, L. (2010). Improved visualization using phase retrieval algorithms in laboratory X‐ray μCT. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts (pp. 219–219). Presented at the 10th International conference on X‐Ray Microscopy (XRM 2010), Chicago, IL, USA: Argonne National Laboratory.
Vancouver
1.
Boone M, De Witte Y, Dierick M, Almeida A, Van den Bulcke J, Van Hoorebeke L. Improved visualization using phase retrieval algorithms in laboratory X‐ray μCT. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. Chicago, IL, USA: Argonne National Laboratory; 2010. p. 219–219.
MLA
Boone, Matthieu, Yoni De Witte, Manuel Dierick, et al. “Improved Visualization Using Phase Retrieval Algorithms in Laboratory X‐ray μCT.” XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts. Chicago, IL, USA: Argonne National Laboratory, 2010. 219–219. Print.