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A flexible modular laboratory X‐ray nano‐CT scanner

Denis Van Loo UGent, Bert Masschaele UGent, Manuel Dierick UGent, Matthieu Boone UGent, Jan Van den Bulcke UGent, Dries Vansteenkiste UGent, Luc Van Hoorebeke UGent, Joris Van Acker UGent and Patric Jacobs UGent (2010) XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. p.181-181
abstract
X‐ray micro/nano‐CT (μCT) has recently become a very powerful and common tool for non‐destructive 3D visualization and analysis of small objects. Many systems are commercially available, but they are typically limited in terms of resolution and/or sample size range, and come in closed cabinets, thus limiting the experimental freedom. The Centre for X‐ray Tomography of the Ghent University (UGCT, Belgium: www.ugct.ugent.be) has designed and built a state‐of‐the‐art modular micro/nano‐CT scanner. Its dual source / dual detector design attains resolutions down to 400 nm for small samples, but also allows scanning samples up to 30 cm in diameter at lower resolution. The performance of the system will be characterized in detail. Specific design elements built‐in to achieve the very high resolution will be presented, as well as the wide range of acquisition modes (helix scanning, tiled acquisition, continuous rotation, etc). A picture of the new scanner is shown in Figure 1. The scanner has already been used in multiple research applications. One of the results can be found in Figure 2, where a very small piece of wood is shown at a voxel size of approx. 500 nm.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
micro-CT, X-ray microscopy
in
XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts
pages
181 - 181
publisher
Argonne National Laboratory
place of publication
Chicago, IL, USA
conference name
10th International conference on X‐Ray Microscopy (XRM 2010)
conference location
Chicago, IL, USA
conference start
2010-08-15
conference end
2010-08-20
language
English
UGent publication?
yes
classification
C3
copyright statement
I have transferred the copyright for this publication to the publisher
id
1105701
handle
http://hdl.handle.net/1854/LU-1105701
date created
2011-01-20 13:43:15
date last changed
2011-04-28 11:03:26
@inproceedings{1105701,
  abstract     = {X\unmatched{2010}ray micro/nano\unmatched{2010}CT (\ensuremath{\mu}CT) has recently become a very powerful and common tool for non\unmatched{2010}destructive 3D visualization and analysis of small objects. Many systems are commercially available, but they are typically limited in terms of resolution and/or sample size range, and come in closed cabinets, thus limiting the experimental freedom. The Centre for X\unmatched{2010}ray Tomography of the Ghent University (UGCT, Belgium: www.ugct.ugent.be) has designed and built a state\unmatched{2010}of\unmatched{2010}the\unmatched{2010}art modular micro/nano\unmatched{2010}CT scanner. Its dual source / dual detector design attains resolutions down to 400 nm for small samples, but also allows scanning samples up to 30 cm in diameter at lower resolution. The performance of the system will be characterized in detail. Specific design elements built\unmatched{2010}in to achieve the very high resolution will be presented, as well as the wide range of acquisition modes (helix scanning, tiled acquisition, continuous rotation, etc). A picture of the new scanner is shown in Figure 1. The scanner has already been used in multiple research applications. One of the results can be found in Figure 2, where a very small piece of wood is shown at a voxel size of approx. 500 nm.},
  author       = {Van Loo, Denis and Masschaele, Bert and Dierick, Manuel and Boone, Matthieu and Van den Bulcke, Jan and Vansteenkiste, Dries and Van Hoorebeke, Luc and Van Acker, Joris and Jacobs, Patric},
  booktitle    = {XRM2010 : 10th International conference on X\unmatched{2010}Ray Microscopy, Book of abstracts},
  keyword      = {micro-CT,X-ray microscopy},
  language     = {eng},
  location     = {Chicago, IL, USA},
  pages        = {181--181},
  publisher    = {Argonne National Laboratory},
  title        = {A flexible modular laboratory X\unmatched{2010}ray nano\unmatched{2010}CT scanner},
  year         = {2010},
}

Chicago
Van Loo, Denis, Bert Masschaele, Manuel Dierick, Matthieu Boone, Jan Van den Bulcke, Dries Vansteenkiste, Luc Van Hoorebeke, Joris Van Acker, and Patric Jacobs. 2010. “A Flexible Modular Laboratory X‐ray nano‐CT Scanner.” In XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts, 181–181. Chicago, IL, USA: Argonne National Laboratory.
APA
Van Loo, D., Masschaele, B., Dierick, M., Boone, M., Van den Bulcke, J., Vansteenkiste, D., Van Hoorebeke, L., et al. (2010). A flexible modular laboratory X‐ray nano‐CT scanner. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts (pp. 181–181). Presented at the 10th International conference on X‐Ray Microscopy (XRM 2010), Chicago, IL, USA: Argonne National Laboratory.
Vancouver
1.
Van Loo D, Masschaele B, Dierick M, Boone M, Van den Bulcke J, Vansteenkiste D, et al. A flexible modular laboratory X‐ray nano‐CT scanner. XRM2010 : 10th International conference on X‐Ray Microscopy, Book of abstracts. Chicago, IL, USA: Argonne National Laboratory; 2010. p. 181–181.
MLA
Van Loo, Denis, Bert Masschaele, Manuel Dierick, et al. “A Flexible Modular Laboratory X‐ray nano‐CT Scanner.” XRM2010 : 10th International Conference on X‐Ray Microscopy, Book of Abstracts. Chicago, IL, USA: Argonne National Laboratory, 2010. 181–181. Print.