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Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis

Koen Janssens, Wout De Nolf, Geert Van Der Snickt, Laszlo Vincze UGent, Bart Vekemans UGent, Roberto Terzano and Frank E Brenker (2010) TRAC-TRENDS IN ANALYTICAL CHEMISTRY. 29(6). p.464-478
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
Composition, Instrumentation, Calibration standard, Confocal mu-XRF, Micro X-ray fluorescence analysis, Microanalytical technique, Material characterization, Quantitative analysis, Synchrotron radiation, MONTE-CARLO-SIMULATION, FLY-ASH PARTICLES, 3-DIMENSIONAL MICRO-XRF, TRACE-ELEMENT ANALYSIS, MU-XRF, SYNCHROTRON-RADIATION, HOMOGENEOUS SAMPLES, POLLUTED SOIL, PAINT LAYERS, HIGH-ENERGY
journal title
TRAC-TRENDS IN ANALYTICAL CHEMISTRY
Trac-Trends Anal. Chem.
volume
29
issue
6
pages
464 - 478
Web of Science type
Article
Web of Science id
000279235000014
JCR category
CHEMISTRY, ANALYTICAL
JCR impact factor
6.602 (2010)
JCR rank
2/71 (2010)
JCR quartile
1 (2010)
ISSN
0165-9936
DOI
10.1016/j.trac.2010.03.003
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1074227
handle
http://hdl.handle.net/1854/LU-1074227
date created
2010-11-16 12:27:49
date last changed
2010-11-18 16:07:57
@article{1074227,
  author       = {Janssens, Koen and De Nolf, Wout and Van Der Snickt, Geert and Vincze, Laszlo and Vekemans, Bart and Terzano, Roberto and Brenker, Frank E},
  issn         = {0165-9936},
  journal      = {TRAC-TRENDS IN ANALYTICAL CHEMISTRY},
  keyword      = {Composition,Instrumentation,Calibration standard,Confocal mu-XRF,Micro X-ray fluorescence analysis,Microanalytical technique,Material characterization,Quantitative analysis,Synchrotron radiation,MONTE-CARLO-SIMULATION,FLY-ASH PARTICLES,3-DIMENSIONAL MICRO-XRF,TRACE-ELEMENT ANALYSIS,MU-XRF,SYNCHROTRON-RADIATION,HOMOGENEOUS SAMPLES,POLLUTED SOIL,PAINT LAYERS,HIGH-ENERGY},
  language     = {eng},
  number       = {6},
  pages        = {464--478},
  title        = {Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis},
  url          = {http://dx.doi.org/10.1016/j.trac.2010.03.003},
  volume       = {29},
  year         = {2010},
}

Chicago
Janssens, Koen, Wout De Nolf, Geert Van Der Snickt, Laszlo Vincze, Bart Vekemans, Roberto Terzano, and Frank E Brenker. 2010. “Recent Trends in Quantitative Aspects of Microscopic X-ray Fluorescence Analysis.” Trac-trends in Analytical Chemistry 29 (6): 464–478.
APA
Janssens, Koen, De Nolf, W., Van Der Snickt, G., Vincze, L., Vekemans, B., Terzano, R., & Brenker, F. E. (2010). Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis. TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 29(6), 464–478.
Vancouver
1.
Janssens K, De Nolf W, Van Der Snickt G, Vincze L, Vekemans B, Terzano R, et al. Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis. TRAC-TRENDS IN ANALYTICAL CHEMISTRY. 2010;29(6):464–78.
MLA
Janssens, Koen, Wout De Nolf, Geert Van Der Snickt, et al. “Recent Trends in Quantitative Aspects of Microscopic X-ray Fluorescence Analysis.” TRAC-TRENDS IN ANALYTICAL CHEMISTRY 29.6 (2010): 464–478. Print.