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The use of exponentially fitted methods in a deferred correction framework

Davy Hollevoet (UGent) , Marnix Van Daele (UGent) and Guido Vanden Berghe (UGent)
(2010) AIP Conference Proceedings. 1281. p.223-226
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Abstract
The combination of exponential fitting and deferred correction based on mono-implicit Runge-Kutta methods is investigated. The structure of the B-series coefficients of exponentially fitted deferred correction (EFDC) schemes is compared to that of classical counterparts. It is shown how the leading error term of an EFDC scheme can be annihilated or minimized.
Keywords
Parameter selection, Boundary value problems, Mono-implicit Runge-Kutta methods, Error term, Exponential fitting, B-series

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Please use this url to cite or link to this publication:

MLA
Hollevoet, Davy, et al. “The Use of Exponentially Fitted Methods in a Deferred Correction Framework.” AIP Conference Proceedings, edited by Theodore Simos et al., vol. 1281, American Institute of Physics (AIP), 2010, pp. 223–26, doi:10.1063/1.3498421.
APA
Hollevoet, D., Van Daele, M., & Vanden Berghe, G. (2010). The use of exponentially fitted methods in a deferred correction framework. In T. Simos, G. Psihoyios, & C. Tsitouras (Eds.), AIP Conference Proceedings (Vol. 1281, pp. 223–226). https://doi.org/10.1063/1.3498421
Chicago author-date
Hollevoet, Davy, Marnix Van Daele, and Guido Vanden Berghe. 2010. “The Use of Exponentially Fitted Methods in a Deferred Correction Framework.” In AIP Conference Proceedings, edited by Theodore Simos, George Psihoyios, and Ch Tsitouras, 1281:223–26. Melville, NY, USA: American Institute of Physics (AIP). https://doi.org/10.1063/1.3498421.
Chicago author-date (all authors)
Hollevoet, Davy, Marnix Van Daele, and Guido Vanden Berghe. 2010. “The Use of Exponentially Fitted Methods in a Deferred Correction Framework.” In AIP Conference Proceedings, ed by. Theodore Simos, George Psihoyios, and Ch Tsitouras, 1281:223–226. Melville, NY, USA: American Institute of Physics (AIP). doi:10.1063/1.3498421.
Vancouver
1.
Hollevoet D, Van Daele M, Vanden Berghe G. The use of exponentially fitted methods in a deferred correction framework. In: Simos T, Psihoyios G, Tsitouras C, editors. AIP Conference Proceedings. Melville, NY, USA: American Institute of Physics (AIP); 2010. p. 223–6.
IEEE
[1]
D. Hollevoet, M. Van Daele, and G. Vanden Berghe, “The use of exponentially fitted methods in a deferred correction framework,” in AIP Conference Proceedings, Rhodes, Greece, 2010, vol. 1281, pp. 223–226.
@inproceedings{1063376,
  abstract     = {{The combination of exponential fitting and deferred correction based on mono-implicit Runge-Kutta methods is investigated. The structure of the B-series coefficients of exponentially fitted deferred correction (EFDC) schemes is compared to that of classical counterparts. It is shown how the leading error term of an EFDC scheme can be annihilated or minimized.}},
  author       = {{Hollevoet, Davy and Van Daele, Marnix and Vanden Berghe, Guido}},
  booktitle    = {{AIP Conference Proceedings}},
  editor       = {{Simos, Theodore and Psihoyios, George and Tsitouras, Ch}},
  isbn         = {{9780735408340}},
  issn         = {{0094-243X}},
  keywords     = {{Parameter selection,Boundary value problems,Mono-implicit Runge-Kutta methods,Error term,Exponential fitting,B-series}},
  language     = {{eng}},
  location     = {{Rhodes, Greece}},
  pages        = {{223--226}},
  publisher    = {{American Institute of Physics (AIP)}},
  title        = {{The use of exponentially fitted methods in a deferred correction framework}},
  url          = {{http://doi.org/10.1063/1.3498421}},
  volume       = {{1281}},
  year         = {{2010}},
}

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