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The origin of Bohm diffusion, investigated by a comparison of different modelling methods

Evi Bultinck, Stijn Mahieu UGent, Diederik Depla UGent and Annemie Bogaerts (2010) JOURNAL OF PHYSICS D-APPLIED PHYSICS. 43(29).
abstract
'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
PLASMA, CYLINDRICAL MAGNETRON DISCHARGE, FLUCTUATIONS, FIELD
journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
J. Phys. D-Appl. Phys.
volume
43
issue
29
article number
292001
pages
5 pages
Web of Science type
Article
Web of Science id
000279638700001
JCR category
PHYSICS, APPLIED
JCR impact factor
2.105 (2010)
JCR rank
31/116 (2010)
JCR quartile
2 (2010)
ISSN
0022-3727
DOI
10.1088/0022-3727/43/29/292001
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1055693
handle
http://hdl.handle.net/1854/LU-1055693
date created
2010-10-08 10:28:29
date last changed
2016-12-21 15:42:16
@article{1055693,
  abstract     = {'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena.},
  articleno    = {292001},
  author       = {Bultinck, Evi and Mahieu, Stijn and Depla, Diederik and Bogaerts, Annemie},
  issn         = {0022-3727},
  journal      = {JOURNAL OF PHYSICS D-APPLIED PHYSICS},
  keyword      = {PLASMA,CYLINDRICAL MAGNETRON DISCHARGE,FLUCTUATIONS,FIELD},
  language     = {eng},
  number       = {29},
  pages        = {5},
  title        = {The origin of Bohm diffusion, investigated by a comparison of different modelling methods},
  url          = {http://dx.doi.org/10.1088/0022-3727/43/29/292001},
  volume       = {43},
  year         = {2010},
}

Chicago
Bultinck, Evi, Stijn Mahieu, Diederik Depla, and Annemie Bogaerts. 2010. “The Origin of Bohm Diffusion, Investigated by a Comparison of Different Modelling Methods.” Journal of Physics D-applied Physics 43 (29).
APA
Bultinck, E., Mahieu, S., Depla, D., & Bogaerts, A. (2010). The origin of Bohm diffusion, investigated by a comparison of different modelling methods. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 43(29).
Vancouver
1.
Bultinck E, Mahieu S, Depla D, Bogaerts A. The origin of Bohm diffusion, investigated by a comparison of different modelling methods. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 2010;43(29).
MLA
Bultinck, Evi, Stijn Mahieu, Diederik Depla, et al. “The Origin of Bohm Diffusion, Investigated by a Comparison of Different Modelling Methods.” JOURNAL OF PHYSICS D-APPLIED PHYSICS 43.29 (2010): n. pag. Print.