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The origin of Bohm diffusion, investigated by a comparison of different modelling methods

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Abstract
'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena.
Keywords
PLASMA, CYLINDRICAL MAGNETRON DISCHARGE, FLUCTUATIONS, FIELD

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Chicago
Bultinck, Evi, Stijn Mahieu, Diederik Depla, and Annemie Bogaerts. 2010. “The Origin of Bohm Diffusion, Investigated by a Comparison of Different Modelling Methods.” Journal of Physics D-applied Physics 43 (29).
APA
Bultinck, E., Mahieu, S., Depla, D., & Bogaerts, A. (2010). The origin of Bohm diffusion, investigated by a comparison of different modelling methods. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 43(29).
Vancouver
1.
Bultinck E, Mahieu S, Depla D, Bogaerts A. The origin of Bohm diffusion, investigated by a comparison of different modelling methods. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 2010;43(29).
MLA
Bultinck, Evi, Stijn Mahieu, Diederik Depla, et al. “The Origin of Bohm Diffusion, Investigated by a Comparison of Different Modelling Methods.” JOURNAL OF PHYSICS D-APPLIED PHYSICS 43.29 (2010): n. pag. Print.
@article{1055693,
  abstract     = {'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena.},
  articleno    = {292001},
  author       = {Bultinck, Evi and Mahieu, Stijn and Depla, Diederik and Bogaerts, Annemie},
  issn         = {0022-3727},
  journal      = {JOURNAL OF PHYSICS D-APPLIED PHYSICS},
  keyword      = {PLASMA,CYLINDRICAL MAGNETRON DISCHARGE,FLUCTUATIONS,FIELD},
  language     = {eng},
  number       = {29},
  pages        = {5},
  title        = {The origin of Bohm diffusion, investigated by a comparison of different modelling methods},
  url          = {http://dx.doi.org/10.1088/0022-3727/43/29/292001},
  volume       = {43},
  year         = {2010},
}

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