Advanced search
1 file | 181.13 KB

Quantitative study of charge trapping in SiO2 during bipolar Fowler-Nordheim injection

(2003) JOURNAL OF NON-CRYSTALLINE SOLIDS. 322(1-3). p.191-198
Author
Organization
Keywords
window closure, non-constant stress, reliability, EEPROM, Fowler–Nordheim, electron trapping, floating gate, model, oxide charge, C-V, I-V, floating-gate technique, SILC, Flash memory, MOS, electrical stress, traps, tunnel oxide

Downloads

    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 181.13 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Busseret, C, N Baboux, C Plossu, Stéphane Burignat, and P Boivin. 2003. “Quantitative Study of Charge Trapping in SiO2 During Bipolar Fowler-Nordheim Injection.” Journal of Non-crystalline Solids 322 (1-3): 191–198.
APA
Busseret, C., Baboux, N., Plossu, C., Burignat, S., & Boivin, P. (2003). Quantitative study of charge trapping in SiO2 during bipolar Fowler-Nordheim injection. JOURNAL OF NON-CRYSTALLINE SOLIDS, 322(1-3), 191–198. Presented at the 4th Franco-Italian Symposium on SiO(2) and Advanced Dielectrics.
Vancouver
1.
Busseret C, Baboux N, Plossu C, Burignat S, Boivin P. Quantitative study of charge trapping in SiO2 during bipolar Fowler-Nordheim injection. JOURNAL OF NON-CRYSTALLINE SOLIDS. 2003;322(1-3):191–8.
MLA
Busseret, C, N Baboux, C Plossu, et al. “Quantitative Study of Charge Trapping in SiO2 During Bipolar Fowler-Nordheim Injection.” JOURNAL OF NON-CRYSTALLINE SOLIDS 322.1-3 (2003): 191–198. Print.
@article{1026550,
  author       = {Busseret, C and Baboux, N and Plossu, C and Burignat, St{\'e}phane and Boivin, P},
  issn         = {0022-3093},
  journal      = {JOURNAL OF NON-CRYSTALLINE SOLIDS},
  keyword      = {window closure,non-constant stress,reliability,EEPROM,Fowler--Nordheim,electron trapping,floating gate,model,oxide charge,C-V,I-V,floating-gate technique,SILC,Flash memory,MOS,electrical stress,traps,tunnel oxide},
  language     = {eng},
  location     = {Trent, Italy},
  number       = {1-3},
  pages        = {191--198},
  title        = {Quantitative study of charge trapping in SiO2 during bipolar Fowler-Nordheim injection},
  url          = {http://dx.doi.org/10.1016/S0022-3093(03)00201-1},
  volume       = {322},
  year         = {2003},
}

Altmetric
View in Altmetric
Web of Science
Times cited: