A novel fault-tolerant logic style with self-checking capability
- Author
- Mahdi Taheri, Saeideh Sheikhpour (UGent) , Ali Mahani and Maksim Jenihhin
- Organization
- Abstract
- We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of fault-tolerant configurable circuits. The AND and OR gates consist of 8 transistors based on CNFET technology, while the proposed XOR gate benefits from both CNFET and low-power MGDI technologies in its transistor arrangement. To demonstrate the feasibility of our new logic gates, we used an AES S-box implementation as the use case. The extensive simulation results using HSPICE indicate that the case-study circuit using on proposed gates has superior speed and power consumption compared to other implementations with error-detection capability.
- Keywords
- Digital circuits, logic level, error detection, self-checking, S-BOX
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-01JJM43ZHNPP4PF0A6V281XBP7
- MLA
- Taheri, Mahdi, et al. “A Novel Fault-Tolerant Logic Style with Self-Checking Capability.” 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), IEEE, 2022, pp. 1–6, doi:10.1109/iolts56730.2022.9897818.
- APA
- Taheri, M., Sheikhpour, S., Mahani, A., & Jenihhin, M. (2022). A novel fault-tolerant logic style with self-checking capability. 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), 1–6. https://doi.org/10.1109/iolts56730.2022.9897818
- Chicago author-date
- Taheri, Mahdi, Saeideh Sheikhpour, Ali Mahani, and Maksim Jenihhin. 2022. “A Novel Fault-Tolerant Logic Style with Self-Checking Capability.” In 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), 1–6. IEEE. https://doi.org/10.1109/iolts56730.2022.9897818.
- Chicago author-date (all authors)
- Taheri, Mahdi, Saeideh Sheikhpour, Ali Mahani, and Maksim Jenihhin. 2022. “A Novel Fault-Tolerant Logic Style with Self-Checking Capability.” In 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), 1–6. IEEE. doi:10.1109/iolts56730.2022.9897818.
- Vancouver
- 1.Taheri M, Sheikhpour S, Mahani A, Jenihhin M. A novel fault-tolerant logic style with self-checking capability. In: 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022). IEEE; 2022. p. 1–6.
- IEEE
- [1]M. Taheri, S. Sheikhpour, A. Mahani, and M. Jenihhin, “A novel fault-tolerant logic style with self-checking capability,” in 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), Torino, ITALY, 2022, pp. 1–6.
@inproceedings{01JJM43ZHNPP4PF0A6V281XBP7,
abstract = {{We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of fault-tolerant configurable circuits. The AND and OR gates consist of 8 transistors based on CNFET technology, while the proposed XOR gate benefits from both CNFET and low-power MGDI technologies in its transistor arrangement. To demonstrate the feasibility of our new logic gates, we used an AES S-box implementation as the use case. The extensive simulation results using HSPICE indicate that the case-study circuit using on proposed gates has superior speed and power consumption compared to other implementations with error-detection capability.}},
author = {{Taheri, Mahdi and Sheikhpour, Saeideh and Mahani, Ali and Jenihhin, Maksim}},
booktitle = {{2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022)}},
isbn = {{9781665473552}},
issn = {{1942-9398}},
keywords = {{Digital circuits,logic level,error detection,self-checking,S-BOX}},
language = {{eng}},
location = {{Torino, ITALY}},
pages = {{1--6}},
publisher = {{IEEE}},
title = {{A novel fault-tolerant logic style with self-checking capability}},
url = {{http://doi.org/10.1109/iolts56730.2022.9897818}},
year = {{2022}},
}
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