Electronic Speckle Pattern Interferometry for fatigue crack monitoring
- Author
- Behzad Vasheghani Farahani (UGent) , Frederico Direito, Pedro J. Sousa, Paulo J. Tavares and Pedro M. P. G. Moreira
- Organization
- Abstract
- This study aims to monitor the fatigue crack tip through a contactless optical method. A Middle Tension (MT) specimen is initially prepared by submitted it to a cyclic fatigue loading, in order to generate a crack with a specified length. Then, the cracked specimen is statically loaded under a uniaxial tensile condition, and Electronic Speckle Pattern Interferometry (ESPI) is employed to monitor the crack tip. During specimen loading with incremental force values, the behavior of the cracked area is monitored, with displacement and deformation fields acquired for each load increment. The obtained data is used to calculate fracture parameters, such as the Stress Intensity Factor (SIF). For that purpose, an overdeterministic algorithm was developed to calculate SIFs for each measured crack length. The main contribution of the present work is the adoption of a high-resolution optical contactless technique to monitor the fatigue crack tip. The obtained SIF values are compared to the reference solution proposed by ASTM E647 and an acceptable agreement has been verified. (C) 2022 The Authors. Published by Elsevier B.V.
- Keywords
- ESPI, Fatigue, Fracture, Crack tip monitoring
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-01H05PK2RNMCJ7N7D1QK85JHGB
- MLA
- Vasheghani Farahani, Behzad, et al. “Electronic Speckle Pattern Interferometry for Fatigue Crack Monitoring.” 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), vol. 37, 2022, pp. 873–79, doi:10.1016/j.prostr.2022.02.021.
- APA
- Vasheghani Farahani, B., Direito, F., Sousa, P. J., Tavares, P. J., & Moreira, P. M. P. G. (2022). Electronic Speckle Pattern Interferometry for fatigue crack monitoring. 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), 37, 873–879. https://doi.org/10.1016/j.prostr.2022.02.021
- Chicago author-date
- Vasheghani Farahani, Behzad, Frederico Direito, Pedro J. Sousa, Paulo J. Tavares, and Pedro M. P. G. Moreira. 2022. “Electronic Speckle Pattern Interferometry for Fatigue Crack Monitoring.” In 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), 37:873–79. https://doi.org/10.1016/j.prostr.2022.02.021.
- Chicago author-date (all authors)
- Vasheghani Farahani, Behzad, Frederico Direito, Pedro J. Sousa, Paulo J. Tavares, and Pedro M. P. G. Moreira. 2022. “Electronic Speckle Pattern Interferometry for Fatigue Crack Monitoring.” In 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), 37:873–879. doi:10.1016/j.prostr.2022.02.021.
- Vancouver
- 1.Vasheghani Farahani B, Direito F, Sousa PJ, Tavares PJ, Moreira PMPG. Electronic Speckle Pattern Interferometry for fatigue crack monitoring. In: 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021). 2022. p. 873–9.
- IEEE
- [1]B. Vasheghani Farahani, F. Direito, P. J. Sousa, P. J. Tavares, and P. M. P. G. Moreira, “Electronic Speckle Pattern Interferometry for fatigue crack monitoring,” in 4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), Online, 2022, vol. 37, pp. 873–879.
@inproceedings{01H05PK2RNMCJ7N7D1QK85JHGB,
abstract = {{This study aims to monitor the fatigue crack tip through a contactless optical method. A Middle Tension (MT) specimen is initially prepared by submitted it to a cyclic fatigue loading, in order to generate a crack with a specified length. Then, the cracked specimen is statically loaded under a uniaxial tensile condition, and Electronic Speckle Pattern Interferometry (ESPI) is employed to monitor the crack tip. During specimen loading with incremental force values, the behavior of the cracked area is monitored, with displacement and deformation fields acquired for each load increment. The obtained data is used to calculate fracture parameters, such as the Stress Intensity Factor (SIF). For that purpose, an overdeterministic algorithm was developed to calculate SIFs for each measured crack length. The main contribution of the present work is the adoption of a high-resolution optical contactless technique to monitor the fatigue crack tip. The obtained SIF values are compared to the reference solution proposed by ASTM E647 and an acceptable agreement has been verified. (C) 2022 The Authors. Published by Elsevier B.V.}},
author = {{Vasheghani Farahani, Behzad and Direito, Frederico and Sousa, Pedro J. and Tavares, Paulo J. and Moreira, Pedro M. P. G.}},
booktitle = {{4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021)}},
issn = {{2452-3216}},
keywords = {{ESPI,Fatigue,Fracture,Crack tip monitoring}},
language = {{eng}},
location = {{Online}},
pages = {{873--879}},
title = {{Electronic Speckle Pattern Interferometry for fatigue crack monitoring}},
url = {{http://doi.org/10.1016/j.prostr.2022.02.021}},
volume = {{37}},
year = {{2022}},
}
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