Project: Measuring and preventing side-channel information leakage in integrated circuits
- project duration
- 01-JAN-05 – 31-DEC-08
- This project aims at en integrated approach for studying the leakage of internal information of digital systems through I/O channels. We will measure the side-channel information leakage (such as through optical channels), model its effects and study possible countermeasures by proposing different design methods at the circuit, instruction and algoritmic level in order to obtain a cost-effective solution to the problem.