Ghent University Academic Bibliography

Advanced

Project: SPECT imaging with semiconductor detectors

project duration
01-JAN-04 – 31-DEC-07
abstract
This project should result in a major improvement of SPECT, by replacing a detector based on a Nal scintillator by a detector based on a semiconductor. With normal detectors the conversion is done indirectly while in semiconductor detectors a direct conversion is done. This will result in a major improvement in energy and spatial resolution.