Project: EDX as used in the development and characterisation of coating/substrate combinations : replacement of a defective and obsolete equipment.
- project duration
- 01-JUL-97 – 31-DEC-99
- The development of coatings for different applications such as HTc superconductive layers, catalytic active coatings on different substrates requires a good overall elemental analysis as well with regard to sensitivity as to lateral resolution. In this respect EDX is an ideal complement to the more surfact sensitive techniques such as XPS and Auger analysis. The proposed project aims at the replacement of a defective and obsolete EDX equipment and a closer integration of EDX in the development of application oriented coatings.