Academic Bibliography

Search 200 years of publications by Ghent University researchers.

Sheng Yang

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- PhD Thesis
- open access
Numerical modelling of performance limiting factors of kesterite and chalcogenide thin film solar cells

Sheng Yang

(2023)
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- Journal Article
- A1
- open access
Investigation of recombination mechanisms in Cu(In,Ga)Se2 solar cells using numerical modelling

Sheng Yang, Samira Khelifi (UGent) , Jessica de Wild, Bart Vermang and Johan Lauwaert (UGent)

(2021) SOLAR ENERGY. 228. p.464-473
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The path towards efficient wide band gap thin-film kesterite solar cells with transparent back contact for viable tandem application

Samira Khelifi (UGent) , Guy Brammertz, Léo Choubrac, Maria Batuk, Sheng Yang, Marc Meuris, Nicolas Barreau, Joke Hadermann, Henk Vrielinck (UGent) , Dirk Poelman (UGent) , et al.

(2021) SOLAR ENERGY MATERIALS AND SOLAR CELLS. 219.
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Numerical modelling of the performance-limiting factors in CZGSe solar cells

Sheng Yang, Samira Khelifi (UGent) , Guy Brammertz, Leo Choubrac, Nicolas Barreau, Pieter Bolt, Bart Vermang and Johan Lauwaert (UGent)

(2020) JOURNAL OF PHYSICS D - APPLIED PHYSICS. 53(38).
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- Journal Article
- A1
- open access
Wide band gap kesterite absorbers for thin film solar cells : potential and challenges for their deployment in tandem devices

Bart Vermang, Guy Brammertz, Marc Meuris, Thomas Schnabel, Erik Ahlswede, Leo Choubrac, Sylvie Harel, Christophe Cardinaux, Ludovic Arzel, Nicolas Barreau, et al.

(2019) SUSTAINABLE ENERGY & FUELS. 3(9). p.2246-2259
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Effect of chemical etching treatment on layer morphology and performance of Cu2ZnGeSe4 solar cells

Samira Khelifi (UGent) , Sheng Yang, Léo Choubrac, Nicolas Barreau, Guy Brammertz, Marc Meuris, Bart Vermang, Maria Batuk, Joke Hadermann, Henk Vrielinck (UGent) , et al.

(2019) E-MRS Spring meeting presentations.
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Discriminating defects and device responses in capacitance spectroscopic methods

Sheng Yang, Johan Lauwaert (UGent) , Samira Khelifi (UGent) , Henk Vrielinck (UGent) , Ana Obradović (UGent) , Jeroen Lauwaert (UGent) and Joris Thybaut (UGent)

(2018) Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts.