Academic Bibliography

Search 200 years of publications by Ghent University researchers.

Vic De Ridder

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Improved defect detection and classification method for advanced IC nodes by using slicing aided hyper inference with refinement strategy

Vic De Ridder, Bappaditya Dey, Victor Blanco, Sandip Halder and Bartel Van Waeyenberge (UGent)

(2024) AIP Conference Proceedings 3164 (1).
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Towards improved semiconductor defect inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS

Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Victor M. Blanco Carballo, Sandip Halder and Philippe Leray

(2024) METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII. In Proceedings of SPIE 12955.
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SEMI-CenterNet : a machine learning facilitated approach for semiconductor defect inspection

Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt and Bartel Van Waeyenberge (UGent)

(2023) 38th European Mask and Lithography Conference (EMLC 2023). In Proceedings of SPIE 12802.
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SEMI-DiffusionInst : a diffusion model based approach for semiconductor defect classification and segmentation

Vic De Ridder, Bappaditya Dey, Sandip Halder and Bartel Van Waeyenberge (UGent)

(2023) 2023 International Symposium ELMAR. p.61-66