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- open access
Signal inversion and defect selectivity in charge pumping electrically detected magnetic resonance of a 4H-SiC n-channel metal-oxide-semiconductor field-effect transistor
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- Journal Article
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Complications of charge pumping analysis for silicon carbide MOSFETs
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Electrically detected magnetic resonance on 4H-SiC MOSFETs using charge pumping
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- Journal Article
- A1
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Non-monotonic threshold voltage variation in 4H-SiC metal–oxide–semiconductor field-effect transistor : investigation and modeling