ir. Niels Lambrecht
No current affiliation with UGent
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Machine learning based error detection in transient susceptibility tests
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- PhD Thesis
- open access
Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits
(2018) -
- Journal Article
- A1
- open access
A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test
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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
(2017) p.1-5 -
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust
(2017) p.141-145 -
- Journal Article
- A1
- open access
Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
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Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices