dr. ir. Martijn Huynen
- Work address
-
Technologiepark Zwijnaarde 126
9052 Zwijnaarde - Martijn.Huynen@UGent.be
- ORCID iD
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0000-0002-5168-9421
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- Journal Article
- open access
Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
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- Conference Paper
- C1
- open access
Interconnect modeling using a surface admittance operator derived with the Fokas method
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- Journal Article
- A1
- open access
Construction of the differential surface admittance operator with an extended Fokas method for electromagnetic scattering at polygonal objects with arbitrary material parameters
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- Conference Paper
- P1
- open access
Accurate characterization of radiation from interconnects on interposer at mmWave frequencies
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- Journal Article
- A1
- open access
A 2-D differential surface admittance operator for combined magnetic and dielectric contrast
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- Conference Paper
- C1
- open access
Comparison of two novel integral equation approaches for lossy conductor modeling
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Analysis of the influence of roughness on the propagation constant of a waveguide via two sparse stochastic methods
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- Journal Article
- A1
- open access
Entire domain basis function expansion of the differential surface admittance for efficient broadband characterization of lossy interconnects
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Reduction of common-mode noise in bent differential interconnects for PAM4 signaling
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Broadband 3-D boundary integral equation characterization of composite conductors