Werner Knaepen
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In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
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Elucidation of the mechanism in fluorine-free prepared YBa2Cu3O7-δ coatings
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High-k dielectrics and metal gates for future generation memory devices
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High-k dielectrics for future generation memory devices (Invited Paper)
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In situ x-ray diffraction study of metal induced crystallization of amorphous germanium
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Crystallization resistance of barium titanate zirconate ultrathin films from aqueous CSD: a study of cause and effect
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0.5 nm EOT low leakage ALD SrTiO3 on TiN MIM capacitors for DRAM applications
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In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon
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Comparative study of flat and round collectors using a validated 1D fluid probe model
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Comparative study of flat and round collectors using a 1D validated fluid probe model