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Anisotropic thermal expansion of Ni, Pd and Pt germanides and silicides
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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films
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- Conference Paper
- C3
- open access
Thermal expansion coefficients of Ni, Pt and Pd germanides and silicides
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Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements
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Determination of the dominant diffusing species during nickel and palladium germanide formation
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- Journal Article
- A1
- open access
In situ study of the growth properties of Ni-rare earth silicides for interlayer and alloy systems on Si(100)
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- PhD Thesis
- open access
Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction
(2010) -
Characterization of solid state reactions andcrystallization in thin films using in-situ X-raydiffraction.
(2010) -
The influence of Pt redistribution on Ni1-xPtxSi growth properties
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In situ X-ray diffraction study of thin film Ir/Si solid state reactions