Wim De Ketelaere

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2000
- P1
- journalArticle
Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration
Wim De Ketelaere, Luc Martens UGent, Y BRAEM and Y VLIETINCK (2000) 2000 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, SYMPOSIUM RECORD. p.449-452 Mark
- C1
- conference
Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration.
Wim De Ketelaere, Luc Martens UGent, Y BRAEM and Y VLIETINCK (2000) Proceedings of the 2000 IEEE International Symposium on Electromagnetic Compatibility, Vol. 1, 21-25 August 2000, Washington, D.C., USA. p.449-452 Mark
- C1
- conference
Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration.
Wim De Ketelaere, Luc Martens UGent, Y BRAEM and Y VLIETINCK (2000) Proceedings of the 4th European Symposium on Electromagnetic Compatibility, Vol. 1, 11-15 September 2000, Brugge, Belgium. p.333-337 Mark
1999
- P1
- journalArticle
Comparison of micro-electronic test structures for noise measurement verification.
Sven Van Den Bosch, Wim De Ketelaere and Luc Martens UGent (1999) ICMTS 1999: PROCEEDINGS OF THE 1999 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES. p.40-44 Mark
- C1
- conference
Comparison of micro-electronic test structures for noise measurement verification.
Sven Van Den Bosch, Wim De Ketelaere and Luc Martens UGent (1999) Proceedings of the 1999 International Conference on Microelectronic Test Structures, 15-18 March 1999, Göteborg, Sweden. p.40-44 Mark