dr. ir. Greet Vanalme 31 – 33 of 33 publications Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Filter publications Download search results Subscribe to news feed Add to list Journal Article A1 BEEM studies of the PtSi/Si(100) interface electronic structure. T VDOVENKOVA, V STRIKHA, Felix Cardon, Roland Vanmeirhaeghe (UGent) and Greet Vanalme (UGent) (1999) JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 105(1). p.15-19 Add to list Conference Paper C1 A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers. Roland Vanmeirhaeghe (UGent) , Greet Vanalme (UGent) , Lieve Goubert, Felix Cardon and Peter Van Daele (UGent) (1998) Materials Research Society Spring Meeting, April San Francisco, USA. Add to list Journal Article A1 A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching. Greet Vanalme (UGent) , Roland Vanmeirhaeghe (UGent) , Felix Cardon and Peter Van Daele (UGent) (1997) SEMICONDUCTOR SCIENCE AND TECHNOLOGY. 12(7). p.907-912 ← Previous 1 2 3 4