prof. dr. ir. Tom Dhaene
work address
Technologiepark Zwijnaarde 15, iGent
9052 Zwijnaarde
9052 Zwijnaarde
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- 2017
- Automated classification of appliances using elliptical fourier descriptors
- Optimized statistical test for event detection in NILM
- Comprehensive feature selection for appliance classification in NILM
- A Kriging and stochastic collocation ensemble for uncertainty quantification in engineering applications
- Time-domain variability analysis of general linear systems terminated with nonlinear devices
- Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion
- On the Bayesian optimization and robustness of event detection methods in NILM
- A novel generative stochastic model for high-speed interconnection links
- Parametric macromodeling of integrated inductors for RF circuit design
- 2016
- Macromodeling of general linear systems under stochastic variations