prof. ir. Eddy Simoen
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Analysis of leakage mechanisms in AlN nucleation layers on p-Si and p-SOI substrates
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On the low-frequency noise of high-kappa gate stacks : what did we learn?
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Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors : physical interpretation of transport phenomena
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Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra
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Bandlike and localized states of extended defects in n-type In0.53Ga0.47As
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Dry passivation process for silicon heterojunction solar cells using hydrogen plasma treatment followed by in situ a-Si:H deposition
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- Journal Article
- A1
- open access
Electrical properties of extended defects in strain relaxed GeSn
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Electrically active defects in plated crystalline silicon n⁺p solar cells : a DLTS perspective
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- Journal Article
- A1
- open access
Dry etch damage in n-type crystalline silicon wafers assessed by deep-level transient spectroscopy and minority carrier lifetime
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- Journal Article
- A1
- open access
On the evolution of strain and electrical properties in As-grown and annealed Si:P epitaxial films for source-drain stressor applications