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Photovia technology: Some important aspects for reliability
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Photovia technology: Some important aspects for reliability.
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The realisation of photo-via technology using multiposit as a photo imageable dielectric
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Electroless Nickel-Gold Stud Bumping on Laminate for Flip-Chip Assembly
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Development of an adhesive TAB joining technology
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Interconnection Technology for Advanced High density Thick Films
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Radiated emission of PCB tracks.
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Characterization of integrated resistors for broadband telecom printed circuit boards
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The use of integrated resistors and buried capacitance in high performance telecom printed circuit boards
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A new cost-effective TAB technology for small and medium volumes
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Interconnection technology for advanced high density thick films
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Photoimageable Thick Films for Multichip Modules
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Samenwerking industrie-universiteit helpt de EMC-materie te ontmaskeren
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Failure mechanisms in dielectrics
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Karakterisatie van PECVD siliciumnitride en toepassing als totale passivatielaag voor chips
(1987) -
Evaluation of PCVD Silicon Nitride as a Total Passivation Layer for Chips.
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P.C.V.D. SIN Conformal Coatings for the Improvement of the Reliability of Wire Bonded Chips.
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A comparison between silicon-nitride films made by PCVD of N2-SiH4/Ar and N2-SiH4/He
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Anisotropie Conductive Adhesives for High Density Interconnections. Proc. of the lste Eur. Conf. on Electron. Packaging Techn., DVS, pp. 66-68, 1994.
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Plhoto-imageable thick films for multichipmodules. International Conference on electronic Technologies, pp. 41-45, Windsor, 1994.
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Fabrication of High Density Multi-Chip Modules with Standard IC Production Equipment. Hybrid Circuits, Nr. 30, pp. 27-30, 1993.