Willy Laflere
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Influence of the growth conditions on the properties of CaS : Eu electroluminescent thin films
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The influence of Se-coevaporation on the emission spectra of CaS:Eu and SrS:Ce thin film electroluminescent devices
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A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky contacts due to mechanical polishing
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An XPS study of the dopants’ valence states and the composition of CaS1−xSex:Eu and SrS1-xSex:Ce thin film electroluminescent devices
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Hydrogen passivation caused by 'soft' sputter etch cleaning of Si
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A detailed XPS study of the rare earth compounds EuS and EuF3
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An XPS study of the effects of semiconductor processing treatments used to make InP optoelectronic devices.
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Influence of defect passivation by hydrogen on the Schottky barrier height of GaAs and InP contacts
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Electrical characteristics of Al/SiO2/n-Si tunnel diodes with an oxide layer grown by rapid thermal oxidation
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Thin film electroluminescence in SrS:Ce: the quest for blue light