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Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation
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Exploration and insights into vertical nanowire/sheet FETs for ultimate scaled circuits/systems
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- Journal Article
- A1
- open access
Novel Y-function methodology parameter estimation from weak to strong inversion operation
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- Journal Article
- A1
- open access
Investigation of DC and low frequency noise parameters of junctionless GAA Si VNW pMOSFETs in the temperature range from 80 K to 340 K
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- Conference Paper
- C3
- open access
DLTS assessment of grown-in defects in hetero-epitaxial gate stacks for stacked silicon nanosheet channels
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- Journal Article
- A1
- open access
Refined analysis of the correlated carrier number and mobility fluctuations mechanism in MOSFETs
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- Journal Article
- A2
- open access
Lateral PIN photodiode with germanium and silicon layer on SOI wafers
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- Journal Article
- A1
- open access
Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?
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- Journal Article
- A1
- open access
Study on low-frequency noise characteristics of hydrogen-terminated diamond FETs
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- Journal Article
- A1
- open access
3D backside integration of FinFETs : is there an impact on LF noise?